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Maslennikov SN, Finkel MI, Antipov SV, Polyakov SL, Zhang W, Ozhegov R, et al. Spiral antenna coupled and directly coupled NbN HEB mixers in the frequency range from 1 to 70 THz. In: Proc. 17th Int. Symp. Space Terahertz Technol. Paris, France; 2006. p. 177–9.
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Svechnikov S, Gol'tsman G, Voronov B, Yagoubov P, Cherednichenko S, Gershenzon E, et al. Spiral antenna NbN hot-electron bolometer mixer at submm frequencies. IEEE Trans Appl Supercond. 1997;7(2):3395–8.
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Krause S, Mityashkin V, Antipov S, Gol'tsman G, Meledin D, Desmaris V, et al. Study of IF bandwidth of NbN hot electron bolometers on GaN buffer layer using a direct measurement method. In: Proc. 27th Int. Symp. Space Terahertz Technol.; 2016. p. 30–2.
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Ryabchun S, Tong C-YE, Blundell R, Kimberk R, Gol'tsman G. Study of the effect of microwave radiation on the operation of HEB mixers in the terahertz frequency range. IEEE Trans Appl Supercond. 2007;17(2):391–4.
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Meledin D, Tong CY-E, Blundell R, Kaurova N, Smirnov K, Voronov B, et al. Study of the IF bandwidth of NbN HEB mixers based on crystalline quartz substrate with an MgO buffer layer. IEEE Trans Appl Supercond. 2003;13(2):164–7.
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Gershenzon EM, Gol'tsman GN, Semenov AD. Submillimeter backward wave tube spectrometer for measuring superconducting film transmission. Pribory i Tekhnika Eksperimenta. 1983;26(5):134–7.
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Gershenzon EM, Gol'tsman GN, Mirskii GI. Submillimeter backward-wave-tube spectrometer-relaxometer. Pribory i Tekhnika Eksperimenta. 1987;30(4):131–7.
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Kaurova NS, Finkel MI, Maslennikov SN, Vahtomin YB, Antipov SV, Smirnov KV, et al. Submillimeter mixer based on YBa2Cu3O7-x thin film. In: Proc. 1-st conf. Fundamental problems of high temperature superconductivity. Moscow-Zvenigorod; 2004. 291.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Submillimeter spectroscopy of semiconductors. Sov Phys JETP. 1973;37(2):299–304.
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Ozhegov R, Morozov D, Maslennikov S, Okunev O, Smirnov K, Gol'tsman G. Submillimeter wave range imaging system for registering human body radiation and finding out the things covered under clothes. In: Proc. 3rd Int. exhibition and conf. Non-Destructive Testing Equipment and Devices. Moscow; 2004.
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