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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Observation of the free-exciton spectrum at submillimeter wavelengths. JETP Lett. 1972;16(4):161–2.
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Boyarskii DA, Gershenzon VE, Gershenzon EM, Gol'tsman GN, Ptitsina NG, Tikhonov VV, et al. On the possibility of determining the microstructural parameters of an oil-bearing layer from radiophysical measurement data. J of Communications Technology and Electronics. 1996;41(5):408–14.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Population and lifetime of excited states of shallow impurities in Ge. Sov Phys JETP. 1979;49(2):355–62.
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Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions. Presumably: Sov Phys Semicond | Физика и техника полупроводников. 1976;10:1379–83.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Submillimeter spectroscopy of semiconductors. Sov Phys JETP. 1973;37(2):299–304.
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Gol'tsman GN, Gusinskii EN, Malyavkin AV, Ptitsina NG, Selevko AG, Edel'shtein VM. The excitonic Zeeman effect in uniaxially-strained germanium. Sov Phys JETP. 1987;65(6):1233–41.
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Gershenson EM, Gol'tsman GN, Elant'ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908–13.
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