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Schuck C, Pernice WHP, Minaeva O, Li M, Gol'tsman G, Sergienko AV, et al. Matrix of integrated superconducting single-photon detectors with high timing resolution. IEEE Trans Appl Supercond. 2013;23(3):2201007.
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Gerecht E, Musante CF, Jian H, Yngvesson KS, Dickinson J, Waldman J, et al. Measured results for NbN phonon-cooled hot electron bolometric mixers at 0.6-0.75 THz, 1.56 THz, and 2.5 THz. In: Proc. 9th Int. Symp. Space Terahertz Technol.; 1998. p. 105–14.
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Meledin D, Tong C-YE, Blundell R, Goltsman G. Measurement of intermediate frequency bandwidth of hot electron bolometer mixers at terahertz frequency range. IEEE Microw Wireless Compon Lett. 2003;13(11):493–5.
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Gershenzon EM, Gol'tsman GN, Karasik BS, Semenov AD. Measurement of the energy gap in the compound YBaCu3O9-δ on the basis of the IR absorption spectrum. JETP Lett. 1987;46(5):237–8.
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Zhang W, Miao W, Li SL, Zhou KM, Shi SC, Gao JR, et al. Measurement of the spectral response of spiral-antenna coupled superconducting hot electron bolometers. IEEE Trans Appl Supercond. 2013;23(3):2300804.
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Bondarenko OI, Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields. Presumably: Sov Phys Semicond | Физика и техника полупроводников. 1972;6:362–3.
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Gershenzon EM, Gol’tsman GN, Semenov AD, Sergeev AV. Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation. IEEE Trans Magn. 1991;27(2):1321–4.
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Gershenzon EM, Gol'tsman GN, Semenov AD, Sergeev AV. Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation. Solid State Communications. 1990;76(4):493–7.
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Baubert J, Salez M, Delorme Y, Pons P, Goltsman G, Merkel H, et al. Membrane-based HEB mixer for THz applications. In: Chiao J-C, Varadan VK, Cané C, editors. Proc. SPIE. Vol 5116. SPIE; 2003. p. 551–62.
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Elmanov I, Elmanova A, Komrakova S, Golikov A, Kaurova N, Kovalyuk V, et al. Method for determination of resists parameters for photonic – integrated circuits e-beam lithography on silicon nitride platform. In: EPJ Web Conf. Vol 220.; 2019. 03012.
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