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Yagubov P, Gol'tsman G, Voronov B, Seidman L, Siomash V, Cherednichenko S, et al. The bandwidth of HEB mixers employing ultrathin NbN films on sapphire substrate. In: Proc. 7th Int. Symp. Space Terahertz Technol. Charlottesville, Virginia, USA; 1996. p. 290–302.
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Kawamura J, Tong C-YE, Blundell R, Papa DC, Hunter TR, Patt F, et al. Terahertz-frequency waveguide NbN hot-electron bolometer mixer. IEEE Trans Appl Supercond. 2001;11(1):952–4.
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Gol’tsman GN. Terahertz technology in Russia. In: 24th European Microwave Conf. Vol 1.; 1994. p. 113–21.
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Gol'tsman GN, Loudkov DN. Terahertz superconducting hot-electron bolometer mixers and their application in radio astronomy. Radiophys. Quant. Electron.. 2003;46(8/9):604–17.
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Hübers H-W, Semenov A, Richter H, Birk M, Krocka M, Mair U, et al. Terahertz heterodyne receiver with a hot-electron bolometer mixer. In: Wold J, Davidson J, editors. Proc. Far-IR, Sub-mm, and mm Detector Technology Workshop.; 2002.
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Cherednichenko S, Drakinskiy V, Lecomte B, Dauplay F, Krieg J-M, Delorme Y, et al. Terahertz heterodyne array based on NbN HEB mixers [abstract]. In: Proc. 19th Int. Symp. Space Terahertz Technol.; 2008. 43.
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Hübers H-W, Semenov A, Richter H, Birk M, Krocka M, Mair U, et al. Terahertz Heterodyn Receiver with a hot-electron bolometer mixer. In: Wolf U, Farhoomand J, McCreight CR, editors. Far-IR, Sub-mm & MM Detector Technology Workshop. NASA; 2002. p. 3–24. (NASA CP).
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Zhang W, Miao W, Zhong JQ, Shi SC, Hayton DJ, Vercruyssen N, et al. Temperature dependence of the receiver noise temperature and IF bandwidth of superconducting hot electron bolometer mixers. Supercond Sci Technol. 2014;27(8):085013 (1 to 5).
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Kawamura J, Blundell R, Tong C-YE, Golts'man G, Gershenzon E, Voronov B. Superconductive NbN hot-electron bolometric mixer performance at 250 GHz. In: Proc. 7th Int. Symp. Space Terahertz Technol.; 1996. p. 331–6.
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Kawamura J, Blundell R, Tong C-YE, Papa DC, Hunter TR, Paine SN, et al. Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation. IEEE Trans Microw Theory Techn. 2000;48(4):683–9.
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