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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Submillimeter spectroscopy of semiconductors. Sov Phys JETP. 1973;37(2):299–304.
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Gershenzon EM, Gol'tsman GN, Mel'nikov AP. Binding energy of a carrier with a neutral impurity atom in germanium and in silicon. JETP Lett. 1971;14(5):185–6.
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Gershenzon EM, Gol'tsman GN. Transitions of electrons between excited states of donors in germanium. JETP Lett. 1971;14(2):63–5.
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Gershenzon EM, Gol'tsman GN, Emtsev VV, Mashovets TV, Ptitsyna NG, Ryvkin SM. Role of impurities of groups III and V in the formation of defects following γ irradiation of germanium. JETP Lett. 1971;14(6):241.
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Smirnov AV, Larionov PA, Finkel MI, Maslennikov SN, Voronov BM, Gol'tsman GN. NbZr films for THz phonon-cooled HEB mixers. In: Proc. 19th Int. Symp. Space Terahertz Technol. Groningen, Netherlands; 2008. p. 44–7.
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Finkel MI, Maslennikov SN, Vachtomin YB, Svechnikov SI, Smirnov KV, Seleznev VA, et al. Hot electron bolometer mixer for 20 – 40 THz frequency range. In: Proc. 16th Int. Symp. Space Terahertz Technol. Göteborg, Sweden; 2005. p. 393–7.
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Maslennikov SN, Finkel MI, Antipov SV, Polyakov SL, Zhang W, Ozhegov R, et al. Spiral antenna coupled and directly coupled NbN HEB mixers in the frequency range from 1 to 70 THz. In: Proc. 17th Int. Symp. Space Terahertz Technol. Paris, France; 2006. p. 177–9.
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Gerecht E, Musante CF, Jian H, Yngvesson KS, Dickinson J, Waldman J, et al. Measured results for NbN phonon-cooled hot electron bolometric mixers at 0.6-0.75 THz, 1.56 THz, and 2.5 THz. In: Proc. 9th Int. Symp. Space Terahertz Technol.; 1998. p. 105–14.
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Semenov AD, Hübers H–W, Schubert J, Gol'tsman GN, Elantiev AI, Voronov BM, et al. Frequency dependent noise temperature of the lattice cooled hot-electron terahertz mixer. In: Proc. 11th Int. Symp. Space Terahertz Technol.; 2000. p. 39–48.
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Vachtomin YB, Antipov SV, Maslennikov SN, Smirnov KV, Polyakov SL, Kaurova NS, et al. Noise temperature measurements of NbN phonon-cooled hot electron bolometer mixer at 2.5 and 3.8 THz. In: Proc. 15th Int. Symp. Space Terahertz Technol. Northampton, Massachusetts, USA; 2004. p. 236–41.
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