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Gol'tsman GN, Gusinskii EN, Malyavkin AV, Ptitsina NG, Selevko AG, Edel'shtein VM. The excitonic Zeeman effect in uniaxially-strained germanium. Sov Phys JETP. 1987;65(6):1233–41.
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Verevkin AA, Ptitsina NG, Chulcova GM, Gol'Tsman GN, Gershenzon EM, Yngvesson KS. Determination of the limiting mobility of a two-dimensional electron gas in AlxGa1-xAs/GaAs heterostructures and direct measurement of the energy relaxation time. Phys Rev B Condens Matter. 1996;53(12):R7592–R7595.
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Verevkin AA, Ptitsina NG, Smirnov KV, Goltsman GN, Gershenson EM, Yngvesson KS. Direct measurements of electron energy relaxation times at an AlGaAs/GaAs heterointerface in the optical phonon scattering range. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 55–8.
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Verevkin AA, Ptitsina NG, Smirnov KV, Gol'tsman GN, Voronov BM, Gershenzon EM, et al. Hot electron bolometer detectors and mixers based on a superconducting-two-dimensional electron gas-superconductor structure. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 163–6.
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Varyukhin SV, Zakharov AA, Gershenzon EM, Gol'tsman GN, Ptitsina NG, Chulkova GM. Low energy excitation in La2CuO4. Sverkhprovodimost': Fizika, Khimiya, Tekhnika. 1990;3(5):832–7.
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Ptitsina NG, Chulkova GM, Il’in KS, Sergeev AV, Pochinkov FS, Gershenzon EM, et al. Electron-phonon interaction in disordered metal films: The resistivity and electron dephasing rate. Phys Rev B. 1997;56(16):10089–96.
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Verevkin AA, Ptitsina NG, Chulcova GM, Gol'tsman GN, Gershenzon EM, Yngvesson KS. Direct measurements of energy relaxation time of electrons in AlGaAs/GaAs heterostructures under quasi-equilibrium conditions. Surface Science. 1996;361-362:569–73.
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Sergeev A, Karasik BS, Ptitsina NG, Chulkova GM, Il'in KS, Gershenzon EM. Electron–phonon interaction in disordered conductors. Phys Rev B Condens Matter. 1999;263-264:190–2.
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Boyarskii DA, Gershenzon VE, Gershenzon EM, Gol'tsman GN, Ptitsina NG, Tikhonov VV, et al. On the possibility of determining the microstructural parameters of an oil-bearing layer from radiophysical measurement data. J of Communications Technology and Electronics. 1996;41(5):408–14.
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Gershenson EM, Gol'tsman GN, Elant'ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908–13.
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