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Kitaygorsky J, Zhang J, Verevkin A, Sergeev A, Korneev A, Matvienko V, et al. Origin of dark counts in nanostructured NbN single-photon detectors. IEEE Trans Appl Supercond. 2005;15(2):545–8.
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Hajenius M, Barends R, Gao JR, Klapwijk TM, Baselmans JJA, Baryshev A, et al. Local resistivity and the current-voltage characteristics of hot electron bolometer mixers. IEEE Trans Appl Supercond. 2005;15(2):495–8.
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Zhang J, Slysz W, Verevkin A, Okunev O, Chulkova G, Korneev A, et al. Response time characterization of NbN superconducting single-photon detectors. IEEE Trans. Appl. Supercond.. 2003;13(2):180–3.
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Semenov AD, Hübers H-W, Richter H, Birk M, Krocka M, Mair U, et al. Superconducting hot-electron bolometer mixer for terahertz heterodyne receivers. IEEE Trans. Appl. Supercond.. 2003;13(2):168–71.
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Meledin D, Tong CY-E, Blundell R, Kaurova N, Smirnov K, Voronov B, et al. Study of the IF bandwidth of NbN HEB mixers based on crystalline quartz substrate with an MgO buffer layer. IEEE Trans Appl Supercond. 2003;13(2):164–7.
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Vachtomin YB, Antipov SV, Kaurova NS, Maslennikov SN, Smirnov KV, Polyakov SL, et al. Noise temperature, gain bandwidth and local oscillator power of NbN phonon-cooled HEB mixer at terahertz frequenciess. In: Proc. 29th IRMMW / 12th THz. Karlsruhe, Germany; 2004. p. 329–30.
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Cherednichenko S, Yagoubov P, Il'in K, Gol'tsman G, Gershenzon E. Large bandwidth of NbN phonon-cooled hot-electron bolometer mixers. In: Proc. 27th Eur. Microwave Conf. Vol 2. IEEE; 1997. p. 972–7.
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Kroug M, Cherednichenko S, Merkel H, Kollberg E, Voronov B, Gol'tsman G, et al. NbN hot electron bolometric mixers for terahertz receivers. IEEE Trans Appl Supercond. 2001;11(1):962–5.
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Beck M, Klammer M, Lang S, Leiderer P, Kabanov VV, Gol'tsman GN, et al. Energy-gap dynamics of superconducting NbN thin films studied by time-resolved terahertz spectroscopy. Phys Rev Lett. 2011;107(17):4.
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Ozhegov RV, Gorshkov KN, Gol'tsman GN, Kinev NV, Koshelets VP. The stability of a terahertz receiver based on a superconducting integrated receiver. Supercond Sci Technol. 2011;24(3):035003.
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