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Anfertev V, Vaks V, Revin L, Pentin I, Tretyakov I, Goltsman G, et al. High resolution THz gas spectrometer based on semiconductor and superconductor devices. In: EPJ Web Conf. Vol 132.; 2017. 02001 (1 to 2).
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Krause S, Mityashkin V, Antipov S, Gol’tsman G, Meledin D, Desmaris V, et al. Reduction of phonon escape time for nbn hot electron bolometers by using gan buffer layers. IEEE Trans Terahertz Sci Technol. 2017;7(1):53–9.
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Trifonov A, Tong C-YE, Lobanov Y, Kaurova N, Blundell R, Goltsman G. Photon absorption near the gap frequency in a hot electron bolometer. IEEE Trans Appl Supercond. 2017;27(4):1–4.
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Goltsman G. Superconducting thin film nanostructures as terahertz and infrared heterodyne and direct detectors. In: 16th ISEC.; 2017. Th-I-QTE-03 (1 to 3).
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Pentin I, Finkel M, Maslennikov S, Vakhtomin Y, Smirnov K, Kaurova N, et al. Superconducting hot-electron-bolometer mixers for the mid-IR. Rus J Radio Electron [Internet]. 2017 [cited 2024 Jul 26];(10):http://jre.cplire.ru/jre/oct17/9/text.pdf. Available from: http://jre.cplire.ru/jre/oct17/9/abstract_e.html
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Zhang J, Verevkin A, Slysz W, Chulkova G, Korneev A, Lipatov A, et al. Time-resolved characterization of NbN superconducting single-photon optical detectors. In: Armitage JC, editor. Proc. SPIE. Vol 10313. SPIE; 2017. 103130F (1 to 3).
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Komrakova S, Javadzade J, Vorobyov V, Bolshedvorskii S, Soshenko V, Akimov A, et al. On-chip controlled placement of nanodiamonds with a nitrogen-vacancy color centers (NV). In: J. Phys.: Conf. Ser. Vol 1124.; 2018. 051046 (1 to 4).
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Мошкова МА, Дивочий АВ, Морозов ПВ, Золотов ФИ, Вахтомин ЮБ, Смирнов КВ. Высокоэффективные NBN однофотонные детекторы с разрешением числа фотонов. In: Сборн. науч. труд. VII международн. конф. по фотонике и информац. опт.; 2018. p. 400–1.
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Bandurin DA, Svintsov D, Gayduchenko I, Xu SG, Principi A, Moskotin M, et al. Resonant terahertz detection using graphene plasmons. Nat Commun. 2018;9:5392 (1 to 8).
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Shurakov A, Mikhalev P, Mikhailov D, Mityashkin V, Tretyakov I, Kardakova A, et al. Ti/Au/n-GaAs planar Schottky diode with a moderately Si-doped matching sublayer. Microelectronic Engineering. 2018;195:26–31.
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