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Ryabchun S, Korneev A, Matvienko V, Smirnov K, Kouminov P, Seleznev V, et al. Superconducting single photon detectors array based on hot electron phenomena. In: Proc. 15th Int. Symp. Space Terahertz Technol.; 2004. p. 242–7.
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Goltsman G, Korneev A, Izbenko V, Smirnov K, Kouminov P, Voronov B, et al. Nano-structured superconducting single-photon detectors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2004;520(1-3):527–9.
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Rubtsova I, Korneev A, Matvienko V, Chulkova G, Milostnaya I, Goltsman G, et al. Spectral sensitivity, quantum efficiency, and noise equivalent power of NbN superconducting single-photon detectors in the IR range. In: Proc. 29th IRMMW / 12th THz.; 2004. p. 461–2.
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Verevkin A, Zhang J, Pearlman A, Slysz W, Sobolewski R, Korneev A, et al. Ultimate sensitivity of superconducting single-photon detectors in the visible to infrared range.; 2004.
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Sobolewski R, Verevkin A, Gol'tsman GN, Lipatov A, Wilsher K. Ultrafast superconducting single-photon optical detectors and their applications. IEEE Trans. Appl. Supercond.. 2003;13(2):1151–7.
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Semenov A, Engel A, Il'in K, Gol'tsman G, Siegel M, Hübers H-W. Ultimate performance of a superconducting quantum detector. Eur Phys J Appl Phys. 2003;21(3):171–8.
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Verevkin A, Slysz W, Pearlman A, Zhang J, Sobolewski R, Okunev O, et al. Real-time GHz-rate counting of infrared photons using nanostructured NbN superconducting detectors. In: CLEO/QELS. Optical Society of America; 2003. CThM8.
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Zhang J, Slysz W, Verevkin A, Okunev O, Chulkova G, Korneev A, et al. Response time characterization of NbN superconducting single-photon detectors. IEEE Trans. Appl. Supercond.. 2003;13(2):180–3.
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Zhang J, Pearlman A, Slysz W, Verevkin A, Sobolewski R, Wilsher K, et al. A superconducting single-photon detector for CMOS IC probing. In: Proc. 16-th LEOS. Vol 2.; 2003. p. 602–3.
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Korneev A, Lipatov A, Okunev O, Chulkova G, Smirnov K, Gol’tsman G, et al. GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits. Microelectronic Engineering. 2003;69(2-4):274–8.
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