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Goltsman G. Quantum-photonic integrated circuits. In: Proc. IWQO.; 2019. p. 22–3.
Abstract: We show the design, a history of development as well as the most successful and promising approaches for QPICs realization based on hybrid nanophotonic-superconducting devices, where one of the key elements of such a circuit is a waveguide integrated superconducting single-photon detector (WSSPD). The potential of integration with fluorescent molecules is discussed also.
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Goltsman G, Naumov AV, Gladush MG, Karimullin KR. Quantum photonic integrated circuits with waveguide integrated superconducting nanowire single-photon detectors. In: EPJ Web Conf. Vol 190.; 2018. 02004 (1 to 2).
Abstract: We show the design, a history of development as well as the most successful and promising approaches for QPICs realization based on hybrid nanophotonic-superconducting devices, where one of the key elements of such a circuit is a waveguide integrated superconducting single-photon detector (WSSPD). The potential of integration with fluorescent molecules is discussed also.
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Fiore A, Marsili F, Bitauld D, Gaggero A, Leoni R, Mattioli F, et al. Counting photons using a nanonetwork of superconducting wires. In: Cheng M, editor. Nano-Net. Berlin, Heidelberg: Springer Berlin Heidelberg; 2009. p. 120–2.
Abstract: We show how the parallel connection of photo-sensitive superconducting nanowires can be used to count the number of photons in an optical pulse, down to the single-photon level. Using this principle we demonstrate photon-number resolving detectors with unprecedented sensitivity and speed at telecommunication wavelengths.
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Sobolewski R, Verevkin A, Gol’tsman GN. Superconducting optical single-photon detectors. In: CLEO/QELS. Optical Society of America; 2004. IThD1.
Abstract: We review the development of superconducting single-photon detectors. The devices are characterized by experimental quantum efficiency of ~8% for infrared photons, counting rate ~2 GHz, 18 ps jitter, and <0.01 per second dark counts.
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Zolotov PI, Divochiy AV, Vakhtomin YB, Lubenchenko AV, Morozov PV, Shurkaeva IV, et al. Influence of sputtering parameters on the main characteristics of ultra-thin vanadium nitride films. In: J. Phys.: Conf. Ser. Vol 1124.; 2018. 051030.
Abstract: We researched the relation between deposition and ultra-thin VN films parameters. To conduct the experimental study we varied substrate temperature, Ar and N2 partial pressures and deposition rate. The study allowed us to obtain the films with close to the bulk values transition temperatures and implement such samples in order to fabricate superconducting single-photon detectors.
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