|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
Ferrari, S.; Kovalyuk, V.; Vetter, A.; Lee, C.; Rockstuhl, C.; Semenov, A.; Gol'tsman, G.; Pernice, W. |
Analysis of the detection response of waveguide-integrated superconducting nanowire single-photon detectors at high count rate |
2019 |
Appl. Phys. Lett. |
115 |
101104 |
|
|
Goltsman, G.; Korneev, A.; Izbenko, V.; Smirnov, K.; Kouminov, P.; Voronov, B.; Kaurova, N.; Verevkin, A.; Zhang, J.; Pearlman, A.; Slysz, W.; Sobolewski, R. |
Nano-structured superconducting single-photon detectors |
2004 |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
520 |
527-529 |
|
|
Zhang, J.; Verevkin, A.; Slysz, W.; Chulkova, G.; Korneev, A.; Lipatov, A.; Okunev, O.; Gol’tsman, G. N.; Sobolewski, Roman |
Time-resolved characterization of NbN superconducting single-photon optical detectors |
2017 |
Proc. SPIE |
10313 |
103130F (1 to 3) |
|
|
Sych, Denis; Shcherbatenko, Michael; Elezov, Michael; Goltsman, Gregory N. |
Towards the improvement of the heterodyne receiver sensitivity beyond the quantum noise limit |
2018 |
Proc. 29th Int. Symp. Space Terahertz Technol. |
|
245-247 |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|