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Kawamura J, Blundell R, Tong C-YE, Gol'tsman G, Gershenzon E, Voronov B. NbN hot-electron mixer measurements at 200 GHz. In: Proc. 6th Int. Symp. Space Terahertz Technol.; 1995. p. 254–61.
Abstract: We present noise and gain measurements of resistively driven NbN hot-electron mixers near 200 GHz. The device geometry is chosen so that the dominant cooling process of the hot-electrons is their interaction with the lattice. Except for a single batch, the intermediate frequency cut-off of these mixer elements is – 3 700 MHz, and has shown little variation among other batches of devices. At 100 MHz we measured intrinsic mixer losses as low as —3 dB. We measured the noise temperatures at several intermediate frequencies, and for the best de- vice at 137 MHz with 20 MHz bandwidth, we measured 2000 K; using a low-noise first- stage amplifier at 1.5 GHz with 200 MHz bandwidth, the receiver noise temperature measured 2800 K. We estimate that the noise contribution from the mixer is 500 K and the total losses are —15 dB at 137 MHz.
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Tong C-YE, Meledin DV, Marrone DP, Paine SN, Gibson H, Blundell R. Near field vector beam measurements at 1 THz. IEEE Microw. Compon. Lett.. 2003;13(6):235–7.
Abstract: We have performed near-field vector beam measurements at 1.03 THz to characterize and align the receiver optics of a superconducting receiver. The signal source is a harmonic generator mounted on an X-Y translation stage. We model the measured two-dimensional complex beam pattern by a fundamental Gaussian mode, from which we derive the position of the beam center, the beam radius and the direction of propagation. By performing scans in the planes separated by 400 mm, we have confirmed that our beam pattern measurements are highly reliable.
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Lobanov Y, Tong C, Blundell R, Gol'tsman G. A study of direct detection effect on the linearity of hot electron bolometer mixers. In: Proc. 20th Int. Symp. Space Terahertz Technol.; 2009. p. 282–7.
Abstract: We have performed a study of how direct detection affects the linearity and hence the calibration of an HEB mixer. Two types of waveguide HEB devices have been used: a 0.8 THz HEB mixer and a 1.0 THz HEB mixer which is ~5 times smaller than the former. Two independent experimental approaches were used. In the ΔG/G method, the conversion gain of the HEB mixer is first measured as a function of the bias current for a number of bias voltages. At each bias setting, we carefully measure the change in the operating current when the input loads are switched. From the measured data, we can derive the expected difference in gain between the hot and cold loads. In the second method (injection method [1]), the linearity of the HEB mixer is independently measured by injecting a modulated signal for different input load temperatures. The results of both approaches confirm that there is gain compression in the operation of HEB mixers. Based on the results of our measurements, we discuss the impact of direct detection effects on the operation of HEB mixers.
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Ryabchun S, Tong C-YE, Blundell R, Kimberk R, Gol'tsman G. Study of the effect of microwave radiation on the operation of HEB mixers in the terahertz frequency range. IEEE Trans Appl Supercond. 2007;17(2):391–4.
Abstract: We have investigated the effect of injecting microwave radiation, with a frequency much lower than that corresponding to the energy gap of the superconductor, on the performance of the hot-electron bolometer mixer incorporated into a THz heterodyne receiver. More specifically, we show that exposing the mixer to microwave radiation does not cause a significant rise of the receiver noise temperature and fall of the mixer conversion gain so long as the microwave power is a small fraction of local oscillator power. The injection of a small, but controlled amount of microwave power therefore enables active compensation of local oscillator power and coupling fluctuations which can significantly degrade the gain stability of hot electron bolometer mixer receivers.
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Tong CE, Trifonov A, Blundell R, Shurakov A, Gol’tsman G. A digital terahertz power meter based on an NbN thin film [abstract]. In: Proc. 25th Int. Symp. Space Terahertz Technol.; 2014. 170.
Abstract: We have further studied the effect of subjecting a superconducting Hot Electron Bolometer (HEB) element made from an NbN thin film to microwave radiation. Since the photon energy is weak, the microwave radiation does not simply heat the film, but generates a bi-static state, switching between the superconducting and normal states, upon the application of a small voltage bias. Indeed, a relaxation oscillation of a few MHz has previously been reported in this regime [1]. Switching between the superconducting and normal states modulates the reflected microwave pump power from the device. A simple homodyne setup readily recovers the spontaneous switching waveform in the time domain. The switching frequency is a function of both the bias voltage (DC heating) and the applied microwave power. In this work, we use a 0.8 THz HEB waveguide mixer for the purpose of demonstration. The applied microwave pump, coupled through a directional coupler, is at 1 GHz. Since the pump power is of the order of a few μW, a room temperature amplifier is sufficient to amplify the reflected pump power from the HEB mixer, which beats with the microwave source in a homodyne set-up. After further amplification, the switching waveform is passed onto a frequency counter. The typical frequency of the switching pulses is 3-5 MHz. It is found that the digital frequency count increases with higher microwave pump power. When the HEB mixer is subjected to additional optical power at 0.8 THz, the frequency count also increases. When we vary the incident optical power by using a wire grid attenuator, a linear relationship is observed between the frequency count and the applied optical power, over at least an order of magnitude of power. This phenomenon can be exploited to develop a digital power meter, using a very simple electronics setup. Further experiments are under way to determine the range of linearity and the accuracy of calibration transfer from the microwave to the THz regime. References 1. Y. Zhuang, and S. Yngvesson, “Detection and interpretation of bistatic effects in NbN HEB devices,” Proc. 13 th Int. Symp. Space THz Tech., 2002, pp. 463–472.
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