| 
Citations
 | 
   web
Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
toggle visibility
Marksteiner M, Divochiy A, Sclafani M, Haslinger P, Ulbricht H, Korneev A, et al. A superconducting NbN detector for neutral nanoparticles. Nanotechnol. 2009;20(45):455501.
toggle visibility
Marsili F, Bitauld D, Divochiy A, Gaggero A, Leoni R, Mattioli F, et al. Superconducting nanowire photon number resolving detector at telecom wavelength. In: CLEO/QELS. Optical Society of America; 2008. Qmj1 (1 to 2).
toggle visibility
Marsili F, Bitauld D, Fiore A, Gaggero A, Leoni R, Mattioli F, et al. Superconducting parallel nanowire detector with photon number resolving functionality. J Modern Opt. 2009;56(2-3):334–44.
toggle visibility
Marsili F, Bitauld D, Fiore A, Gaggero A, Mattioli F, Leoni R, et al. Photon-number-resolution at telecom wavelength with superconducting nanowires [Internet].; 2010 [cited 2024 Jul 2].IntechOpen [DOI:10.5772/6920]. Available from: http://dx.doi.org/10.5772/6920
toggle visibility