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Gershenson EM, Gol'tsman GN, Elant'ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908–13.
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Gershenzon EM, Goltsman GN. Zeeman effect in excited-states of donors in germanium. Sov Phys Semicond. 1972;6(3):509.
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Gershenzon EM, Goltsman GN, Ptitsyna NG. Investigation of excited donor states in GaAs. Sov Phys Semicond. 1974;7(10):1248–50.
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Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions. Presumably: Sov Phys Semicond | Физика и техника полупроводников. 1976;10:1379–83.
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Morozov DV, Smirnov KV, Smirnov AV, Lyakhov VA, Goltsman GN. A millimeter-submillimeter phonon-cooled hot-electron bolometer mixer based on two-dimensional electron gas in an AlGaAs/GaAs heterostructure. Semicond. 2005;39(9):1082–6.
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