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Author  |
Title |
Year |
Publication |
DOI |
Links |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
|
|
|
Marksteiner, M.; Divochiy, A.; Sclafani, M.; Haslinger, P.; Ulbricht, H.; Korneev, A.; Semenov, A.; Gol'tsman, G.; Arndt, M. |
A superconducting NbN detector for neutral nanoparticles |
2009 |
Nanotechnol. |
10.1088/0957-4484/20/45/455501 |
|
|
|
Marsili, F.; Bitauld, D.; Divochiy, A.; Gaggero, A.; Leoni, R.; Mattioli, F.; Korneev, A.; Seleznev, V.; Kaurova, N.; Minaeva, O.; Gol’tsman, G.; Lagoudakis, K.G.; Benkahoul, M.; Lévy, F.; Fiore, A. |
Superconducting nanowire photon number resolving detector at telecom wavelength |
2008 |
CLEO/QELS |
|
|
|
|
Marsili, F.; Bitauld, D.; Fiore, A.; Gaggero, A.; Leoni, R.; Mattioli, F.; Divochiy, A.; Korneev, A.; Seleznev, V.; Kaurova, N.; Minaeva, O.; Goltsman, G. |
Superconducting parallel nanowire detector with photon number resolving functionality |
2009 |
J. Modern Opt. |
10.1080/09500340802220729 |
|
|
|
Marsili, F.; Verma, V. B.; Stern, J. A.; Harrington, S.; Lita, A. E.; Gerrits, T.; Vayshenker, I.; Baek, B.; Shaw, M. D.; Mirin, R. P.; Nam, S. W. |
Detecting single infrared photons with 93% system efficiency |
2013 |
Nat. Photon. |
10.1038/nphoton.2013.13 |
|
