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Author |
Zhizhon, Yan; Majedi, Hamed A. |
Title |
Optoelectronic mixing in the NbN superconducting nanowire single photon detectors |
Type |
Conference Article |
Year |
2009 |
Publication |
Proc. SPIE |
Abbreviated Journal |
Proc. SPIE |
Volume |
3786 |
Issue |
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Pages |
9 |
Keywords |
Optoelectronic devices, microwave superconductivity, nonlinearity, single photon detector, superconductivity, nanowire, optical mixing, microwave mixers, amplitude modulation, intensity modulation. |
Abstract |
In this paper, we present our experimental results on the electrically pumped optoelectronic mixing effect exhibited in a niobium nitride (NbN) superconducting nanowire. The experimental setup in order to test the mixer has been reported in detail. This superconductive nanowire optoelectronic mixer demonstrates photodetection and mixing in an integrated manner. We have explored both effects under a great variety of external conditions, such as temperature and bias current, in order to seek potential ways toward quantum optoelectronic detection and mixing by such nanowire device. |
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RPLAB @ gujma @ |
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651 |
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Author |
Zhou, Y.D.; Becker, C. R.; Ashokan, R.; Selamet, Y.; Chang, Y.; Boreiko, R. T.; Betz, A. L.; Sivananthan, S. |
Title |
Progress in far-infrared detection technology |
Type |
Conference Article |
Year |
2002 |
Publication |
Proc. SPIE |
Abbreviated Journal |
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Volume |
4795 |
Issue |
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Pages |
121-128 |
Keywords |
HgCdTe/CdTe, detector |
Abstract |
II-VI intrinsic very long wavelength infrared (VLWIR, λc~20 to 50 μm) materials, HgCdTe alloys as well as HgCdTe/CdTe superlattices, were grown by molecular beam epitaxy (MBE). The layers were characterized by means of X-ray diffraction, conventional Fourier transform infrared spectroscopy, Hall effect measurements and transmittance electron microscopy (TEM). Photoconductor devices were processed and their spectral response was also measured to demonstrate their applicability in the VLWIR region. |
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Longshore, R. E.; Sivananthan, S. |
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Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series |
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471 |
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