Gao GR, Hovenier JN, Yang ZQ, Baselmans JJA, Baryshev A, Hajenius M, et al. A novel terahertz heterodyne receiver based on a quantum cascade laser and a superconducting bolometer. In: Proc. 16th Int. Symp. Space Terahertz Technol. Göteborg, Sweden; 2005. p. 19–23.
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Gao JR, Hovenier JN, Yang ZQ, Baselmans JJA, Baryshev A, Hajenius M, et al. Terahertz heterodyne receiver based on a quantum cascade laser and a superconducting bolometer. Appl. Phys. Lett.. 2005;(86).
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Baselmans JJA, Baryshev A, Reker SF, Hajenius M, Gao JR, Klapwijk TM, et al. Direct detection effect in small volume hot electron bolometer mixers. Appl Phys Lett. 2005;86(16):163503 (1 to 3).
Abstract: We measure the direct detection effect in a small volume (0.15μm×1μm×3.5nm)(0.15μm×1μm×3.5nm) quasioptical NbN phonon cooled hot electronbolometermixer at 1.6THz1.6THz. We find that the small signal sensitivity of the receiver is underestimated by 35% due to the direct detection effect and that the optimal operating point is shifted to higher bias voltages when using calibration loads of 300K300K and 77K77K. Using a 200GHz200GHzbandpass filter at 4.2K4.2K the direct detection effect virtually disappears. This has important implications for the calibration procedure of these receivers in real telescope systems.
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Hajenius M, Baselmans JJA, Baryshev A, Gao JR, Klapwijk TM, Kooi JW, et al. Full characterization and analysis of a terahertz heterodyne receiver based on a NbN hot electron bolometer. J. Appl. Phys.. 2006;100(7):074507.
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Hajenius M, Baselmans JJA, Gao JR, Klapwijk TM, de Korte PAJ, Voronov B, et al. Improved NbN phonon cooled hot electron bolometer mixers. In: Proc. 14th Int. Symp. Space Terahertz Technol. Tucson, USA; 2003. p. 413–23.
Abstract: NbN phonon-cooled hot electron bolometer mixers (HEBs) have been realized with negligible contact resistance to Au pads. By adding either a 5 nm Nb or a 10 nm NbTiN layer between the Au and NbN, to preserve superconductivity in the NbN under the Au contact pad, superior noise temperatures have been obtained. Using DC I,V curves and resistive transitions in combination with process parameters we analyze the nature of these improved devices and determine interface transparencies.
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