Records |
Author |
Hajenius, M.; Baselmans, J. J. A.; Baryshev, A.; Gao, J. R.; Klapwijk, T. M.; Kooi, J. W.; Jellema, W.; Yang, Z. Q. |
Title |
Full characterization and analysis of a terahertz heterodyne receiver based on a NbN hot electron bolometer |
Type |
Journal Article |
Year |
2006 |
Publication |
J. Appl. Phys. |
Abbreviated Journal |
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Volume |
100 |
Issue |
7 |
Pages |
074507 |
Keywords |
HEB |
Abstract |
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ISSN |
0021-8979 |
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Call Number |
RPLAB @ s @ |
Serial |
385 |
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Author |
Kooi, J. W.; Baselmans, J. J. A.; Hajenius, M.; Gao, J. R.; Klapwijk, T. M.; Dieleman, P.; Baryshev, A.; de Lange, G. |
Title |
IF impedance and mixer gain of NbN hot electron bolometers |
Type |
Journal Article |
Year |
2007 |
Publication |
J. Appl. Phys. |
Abbreviated Journal |
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Volume |
101 |
Issue |
4 |
Pages |
044511 |
Keywords |
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ISSN |
0021-8979 |
ISBN |
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no |
Call Number |
RPLAB @ s @ |
Serial |
445 |
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Author |
Gao, J. R.; Hajenius, M.; Tichelaar, F. D.; Klapwijk, T. M.; Voronov, B.; Grishin, E.; Gol’tsman, G.; Zorman, C. A.; Mehregany, M. |
Title |
Monocrystalline NbN nanofilms on a 3C-SiC∕Si substrate |
Type |
Journal Article |
Year |
2007 |
Publication |
Appl. Phys. Lett. |
Abbreviated Journal |
Appl. Phys. Lett. |
Volume |
91 |
Issue |
6 |
Pages |
062504 (1 to 3) |
Keywords |
NbN films, nanofilms |
Abstract |
The authors have realized NbN (100) nanofilms on a 3C-SiC (100)/Si(100) substrate by dc reactive magnetron sputtering at 800°C. High-resolution transmission electron microscopy (HRTEM) is used to characterize the films, showing a monocrystalline structure and confirming epitaxial growth on the 3C-SiC layer. A film ranging in thickness from 3.4to4.1nm shows a superconducting transition temperature of 11.8K, which is the highest reported for NbN films of comparable thickness. The NbN nano-films on 3C-SiC offer a promising alternative to improve terahertz detectors. For comparison, NbN nanofilms grown directly on Si substrates are also studied by HRTEM.
The authors acknowledge S. V. Svetchnikov at National Centre for HRTEM at Delft, who prepared the specimens for HRTEM inspections. This work was supported by the EU through RadioNet and INTAS. |
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ISSN |
0003-6951 |
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no |
Call Number |
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Serial |
1425 |
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Author |
Hajenius, M.; Baselmans, J. J. A.; Gao, J. R.; Klapwijk, T. M.; de Korte, P. A. J.; Voronov, B.; Gol'tsman, G. |
Title |
Low noise NbN superconducting hot electron bolometer mixers at 1.9 and 2.5 THz |
Type |
Journal Article |
Year |
2004 |
Publication |
Supercond. Sci. Technol. |
Abbreviated Journal |
Supercond. Sci. Technol. |
Volume |
17 |
Issue |
5 |
Pages |
S224-S228 |
Keywords |
NbN HEB mixers |
Abstract |
NbN phonon-cooled hot electron bolometer mixers (HEBs) have been realized with negligible contact resistance between the bolometer itself and the contact structure. Using a combination of in situ cleaning of the NbN film and the use of an additional superconducting interlayer of a 10 nm NbTiN layer between the Au of the contact structure and the NbN film superior noise temperatures have been obtained as low as 950 K at 2.5 THz and 750 K at 1.9 THz. Here we address in detail the DC characterization of these devices, the interface transparencies between the bolometers and the contacts and the consequences of these factors on the mixer performance. |
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ISSN |
0953-2048 |
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no |
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Serial |
558 |
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Author |
Yang, Z. Q.; Hajenius, M.; Baselmans, J. J. A.; Gao, J. R.; Voronov, B.; Gol’tsman, G. N. |
Title |
Reduced noise in NbN hot-electron bolometer mixers by annealing |
Type |
Journal Article |
Year |
2006 |
Publication |
Supercond. Sci. Technol. |
Abbreviated Journal |
Supercond. Sci. Technol. |
Volume |
19 |
Issue |
4 |
Pages |
L (9 to 12) |
Keywords |
NbN HEB mixers |
Abstract |
We find that the sensitivity of heterodyne receivers based on superconducting hot-electron bolometers (HEBs) increases by 25–30% after annealing at 85 °C in vacuum. The devices studied are twin-slot antenna coupled mixers with a small NbN bridge of 1 × 0.15 µm2. We show that annealing changes the device properties as reflected in sharper resistive transitions of the complete device, apparently reducing the device-related noise. The lowest receiver noise temperature of 700 K is measured at a local oscillator frequency of 1.63 THz and a bath temperature of 4.3 K. |
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0953-2048 |
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Call Number |
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Serial |
1456 |
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