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Author |
Title |
Year |
Publication |
DOI  |
Links |
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Goltsman, G.; Korneev, A.; Izbenko, V.; Smirnov, K.; Kouminov, P.; Voronov, B.; Kaurova, N.; Verevkin, A.; Zhang, J.; Pearlman, A.; Slysz, W.; Sobolewski, R. |
Nano-structured superconducting single-photon detectors |
2004 |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
10.1016/j.nima.2003.11.305 |
|
|
|
Korneev, A.; Korneeva, Y.; Florya, I.; Voronov, B.; Goltsman, G. |
NbN nanowire superconducting single-photon detector for mid-infrared |
2012 |
Phys. Procedia |
10.1016/j.phpro.2012.06.215 |
|
|
|
Seki, T.; Shibata, H.; Takesue, H.; Tokura, Y.; Imoto, N. |
Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode |
2010 |
Phys. C |
10.1016/j.physc.2010.05.156 |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
|
|
|
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
10.1016/S0167-9317(03)00309-5 |
|
