|
Lobanov YV, Tong C-YE, Hedden AS, Blundell R, Gol'tsman GN. Microwave-assisted슠measurement슠of the슠frequency슠response슠of슠terahertz슠HEB슠mixers슠with a슠fourier슠transform슠spectrometer. In: 21st International Symposium on Space Terahertz Technology.; 2010. p. 420–3.
Abstract: We describe a novel method of operation of the HEB direct detector for use with a Fourier Transform Spectrometer. Instead of elevating the bath temperature, we have measured the RF response of waveguide HEB mixers by applying microwave radiation to select appropriate bias conditions. In our experiment, a microwave signal is injected into the HEB mixer via its IF port. By choosing an appropriate injection level, the device can be operated close to the desired operating point. Furthermore, we have shown that both thermal biasing and microwave injection can reproduce the same spectral response of the HEB mixer. However, with the use of microwave injection, there is no need to wait for the mixer to reach thermal equilibrium, so characterisation can be done in less time. Also, the liquid helium consumption for our wet cryostat is also reduced. We have demonstrated that the signalto-noise ratio of the FTS measurements can be improved with microwave injection.
|
|
|
Lobanov YV, Tong C-yu E, Hedden AS, Blundell R, Gol’tsman GN. Microwave-assisted measurement of the frequency response of terahertz HEB mixers with a Fourier transform spectrometer. In: Proc. 21th Int. Symp. Space Terahertz Technol.; 2010. p. 420–3.
Abstract: We describe a novel method of operation of the HEB direct detector for use with a Fourier Transform Spectrometer. Instead of elevating the bath temperature, we have measured the RF response of waveguide HEB mixers by applying microwave radiation to select appropriate bias conditions. In our experiment, a microwave signal is injected into the HEB mixer via its IF port. By choosing an appropriate injection level, the device can be operated close to the desired operating point. Furthermore, we have shown that both thermal biasing and microwave injection can reproduce the same spectral response of the HEB mixer. However, with the use of microwave injection, there is no need to wait for the mixer to reach thermal equilibrium, so characterisation can be done in less time. Also, the liquid helium consumption for our wet cryostat is also reduced. We have demonstrated that the signal- to-noise ratio of the FTS measurements can be improved with microwave injection.
|
|
|
Schwarz B. Lidar: Mapping the world in 3D. Nat Photon. 2010;4(7):429–30.
Abstract: A high-definition LIDAR system with a rotating sensor head containing 64 semiconductor lasers allows the efficient generation of 3D environment maps at unprecedented levels of detail.
|
|
|
Kok P. Quantum optics: Entangled photons report for duty. Nat Photon. 2010;4(8):504–5.
Abstract: Entangled photons are a key ingredient in optical quantum technologies, but researchers have so far been unable to produce a single pair of entangled photons. Now, two groups from China and Austria independently report just that, with a technique that avoids the need to infer entanglement from detection signatures.
|
|
|
Freer EM, Grachev O, Duan X, Martin S, Stumbo DP. High-yield self-limiting single-nanowire assembly with dielectrophoresis. Nat Nanotech. 2010;5(7):525–530.
Abstract: Single-crystal nanowire transistors and other nanowire-based devices could have applications in large-area and flexible electronics if conventional top-down fabrication techniques can be integrated with high-precision bottom-up nanowire assembly. Here, we extend dielectrophoretic nanowire assembly to achieve a 98.5% yield of single nanowires assembled over 16,000 patterned electrode sites with submicrometre alignment precision. The balancing of surface, hydrodynamic and dielectrophoretic forces makes the self-assembly process controllable, and a hydrodynamic force component makes it self-limiting. Our approach represents a methodology to quantify nanowire assembly, and makes single nanowire assembly possible over an area limited only by the ability to reproduce process conditions uniformly.
|
|