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Floet D. W., Gao J. R., Klapwijk T. M., de Korte P. A. J. Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers. Appl Phys Lett. 2000;77:1719.
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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Gerecht E, Musante CF, Zhuang Y, Ji M, Yngvesson KS, Goyette T, et al. NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit. In: Proc. IMS. Vol 2.; 2000. p. 1007–10.
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Kawamura J, Blundell R, Tong C-YE, Papa DC, Hunter TR, Paine St. N, et al. Superconductive hot-electron bolometer mixer receiver for 800 GHz operation. Vol 48.; 2000.
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Kawamura J, Blundell R, Tong C-YE, Papa DC, Hunter TR, Paine SN, et al. Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation. IEEE Trans Microw Theory Techn. 2000;48(4):683–9.
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