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Gershenzon EM, Gershenzon ME, Gol'tsman GN, Karasik BS, Semenov AD, Sergeev AV. Light-induced heating of electrons and the time of the inelastic electron-phonon scattering in the YBaCuO compound. JETP Lett. 1987;46(6):285–7.
Abstract: For the first time, measurements have been made on the electron energy relaxation time due to the electron--phonon interaction in films of the YBaCuO superconductor. The results indicate a significant intensification of the electron--phonon interaction in this compound as compared with normal superconducting metals.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG, Riger ER. Effect of electron-electron collisions on the trapping of free carriers by shallow impurity centers in germanium. Sov Phys JETP. 1986;64(4):889–97.
Abstract: Cascade Auger recombination of free carriers on shallow impurities in Ge is investigated under quasi-equilibrium conditions (T= 2-12 K) and in impurity breakdown. The Auger capture cross sections are found to be a,= 5. 10-l9 T-'n cm2 for donors and uip= 7- T-5p cm2 for acceptors. It is shown that in an isotropic semiconductor (p-Ge) ui is well described by the cascade-capture theory that takes into account only electron-electron collisions. In an anisotropic semiconductor ui is considerably larger (n-Ge, strongly uniaxially compressedp-Ge). Under impurity breakdown conditions the electron-electron collisions determine the lifetimes of the free carriers only in samples with appreciable density of the compensating impurity (Nk loi3 cmP3).
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Observation of the free-exciton spectrum at submillimeter wavelengths. JETP Lett. 1972;16(4):161–2.
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Gershenson EM, Gol'tsman GN, Elant'ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908–13.
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Gershenzon E, Gershenzon ME, Gol'tsman GN, Semenov AD, Sergeev AV. Heating of quasiparticles in a superconducting film in the resistive state. JETP Lett. 1981;34(5):268–71.
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