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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Hoevers HFC, Bento AC, Bruijn MP, Gottardi L, Korevaar MAN, Mels WA, et al. Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Appl Phys Lett. 2000;77(26):4421–4.
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Nagatsuma T, Hirata A, Royter Y, Shinagawa M, Furuta T, Ishibashi T, et al. A 120-GHz integrated photonic transmitter. In: Proc. International topical meeting on microwave photonics (MWP 2000).; 2000. p. 225–8.
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Cherednichenko S, Rönnung F, Gol'tsman G, Kollberg E, Winkler D. YBa2Cu3O7−δ hot-electron bolometer mixer. Phys C: Supercond. 2000;341-348:2653–4.
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Cherednichenko S, Rönnung F, Gol’tsman G, Kollberg E, Winkler D. YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz. In: Proc. 11th Int. Symp. Space Terahertz Technol.; 2000. p. 517–22.
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