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Author |
Title |
Year |
Publication |
DOI |
Links |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
|
|
|
Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
10.1109/IPFA.2005.1469119 |
|
|
|
Marsili, F.; Verma, V. B.; Stern, J. A.; Harrington, S.; Lita, A. E.; Gerrits, T.; Vayshenker, I.; Baek, B.; Shaw, M. D.; Mirin, R. P.; Nam, S. W. |
Detecting single infrared photons with 93% system efficiency |
2013 |
Nat. Photon. |
10.1038/nphoton.2013.13 |
|
|
|
Kitaygorsky, J.; Zhang, J.; Verevkin, A.; Sergeev, A.; Korneev, A.; Matvienko, V.; Kouminov, P.; Smirnov, K.; Voronov, B.; Gol'tsman, G.; Sobolewski, R. |
Origin of dark counts in nanostructured NbN single-photon detectors |
2005 |
IEEE Trans. Appl. Supercond. |
10.1109/TASC.2005.849914 |
|
|
|
Zhang, Jin; Slysz, W.; Verevkin, A.; Okunev, O.; Chulkova, G.; Korneev, A.; Lipatov, A.; Gol'tsman, G. N.; Sobolewski, R. |
Response time characterization of NbN superconducting single-photon detectors |
2003 |
IEEE Trans. Appl. Supercond. |
10.1109/TASC.2003.813675 |
|
