Home | << 1 2 >> |
Author | Title | Year | Publication | Volume | Pages |
---|---|---|---|---|---|
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. | Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors | 1983 | Sov. Phys. Semicond. | 17 | 908-913 |
Gershenzon, E. M.; Gol'tsman, G. N.; Dzardanov, A. L.; Elant'ev, A. I.; Zorin, M. A.; Markin, A. G.; Semenov, A. D. | S-N switching of niobium and YBCO films: limit time and perspective of fast key element creation | 1992 | Sverkhprovodimost': Fizika, Khimiya, Tekhnika | 5 | 2386-2402 |