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Author |
Floet, D. Wilms; Baselmans, J. J. A.; Klapwijk, T. M.; Gao, J. R. |
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Title |
Resistive transition of niobium superconducting hot-electron bolometer mixers |
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Journal Article |
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Year |
1998 |
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Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
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73 |
Issue |
19 |
Pages |
2826 |
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Keywords |
HEB |
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0003-6951 |
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543 |
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Barends, R.; Hajenius, M.; Gao, J. R.; Klapwijk, T. M. |
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Title |
Current-induced vortex unbinding in bolometer mixers |
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Journal Article |
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Year |
2005 |
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Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
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Volume |
87 |
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263506 (1 to 3) |
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Keywords |
HEB mixer numerical model, HEB model, IV-curves, vortex-antivortex, Berezinskii–Kosterlitz–Thouless theory, diffusion cooling channel, diffusion channel, distributed HEB model, distributed model, self-heating effect, temperature profile |
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We present a description of the current-voltage characteristics of hot electron bolometers in terms of the current-dependent intrinsic resistive transition of NbN films. We find that, by including this current dependence, we can correctly predict the complete current-voltage characteristics, showing excellent agreement with measurements for both low and high bias and for small as well as large devices. It is assumed that the current dependence is due to vortex-antivortex unbinding as described in the Berezinskii–Kosterlitz–Thouless theory. The presented approach will be useful in guiding device optimization for noise and bandwidth. |
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604 |
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Zhang, W.; Khosropanah, P.; Gao, J. R.; Kollberg, E. L.; Yngvesson, K. S.; Bansal, T.; Barends, R.; Klapwijk, T. M. |
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Title |
Quantum noise in a terahertz hot electron bolometer mixer |
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Journal Article |
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2010 |
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Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
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Volume |
96 |
Issue |
11 |
Pages |
111113-(1-3) |
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Keywords |
HEB mixer, quantum limit, quantum noise, vacuum box, THz, Terahertz |
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We have measured the noise temperature of a single, sensitive superconducting NbN hot electron bolometer (HEB) mixer in a frequency range from 1.6 to 5.3 THz, using a setup with all the key components in vacuum. By analyzing the measured receiver noise temperature using a quantum noise (QN) model for HEB mixers, we confirm the effect of QN. The QN is found to be responsible for about half of the receiver noise at the highest frequency in our measurements. The beta-factor (the quantum efficiency of the HEB) obtained experimentally agrees reasonably well with the calculated value. |
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624 |
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Tanner, M. G.; Natarajan, C. M.; Pottapenjara, V. K.; O'Connor, J. A.; Warburton, R. J.; Hadfield, R. H.; Baek, B.; Nam, S.; Dorenbos, S. N.; Bermúdez Ureña, E.; Zijlstra, T.; Klapwijk, T. M.; Zwiller, V. |
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Title |
Enhanced telecom wavelength single-photon detection with NbTiN superconducting nanowires on oxidized silicon |
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Journal Article |
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Year |
2010 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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Volume |
96 |
Issue |
22 |
Pages |
3 |
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Keywords |
SNSPD |
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Superconducting nanowire single-photon detectors (SNSPDs) have emerged as a highly promising infrared single-photon detector technology. Next-generation devices are being developed with enhanced detection efficiency (DE) at key technological wavelengths via the use of optical cavities. Furthermore, new materials and substrates are being explored for improved fabrication versatility, higher DE, and lower dark counts. We report on the practical performance of packaged NbTiN SNSPDs fabricated on oxidized silicon substrates in the wavelength range from 830 to 1700 nm. We exploit constructive interference from the SiO2/Si interface in order to achieve enhanced front-side fiber-coupled DE of 23.2 % at 1310 nm, at 1 kHz dark count rate, with 60 ps full width half maximum timing jitter. |
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RPLAB @ gujma @ |
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655 |
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Gao, J. R.; Hovenier, J. N.; Yang, Z. Q.; Baselmans, J. J. A.; Baryshev, A.; Hajenius, M.; Klapwijk, T. M.; Adam, A. J. L.; Klaassen, T. O.; Williams, B. S.; Kumar, S.; Hu, Q.; Reno, J. L. |
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Title |
Terahertz heterodyne receiver based on a quantum cascade laser and a superconducting bolometer |
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Journal Article |
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Year |
2005 |
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Appl. Phys. Lett. |
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86 |
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art.num. 244104 |
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RPLAB @ s @ qc_lasers_gao |
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368 |
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