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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Hübers H-W, Semenov A, Schubert J, Gol'tsman G, Voronov B, Gershenzon E. Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz. In: Proc. 8-th Int. Conf. on Terahertz Electronics.; 2000. p. 117–9.
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Semenov AD, Gol’tsman GN. Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector. J Appl Phys. 2000;87(1):502–10.
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Huebers H-W, Semenov A, Schubert J, Gol’tsman GN, Voronov BM, Gershenzon EM, et al. NbN hot-electron bolometer as THz mixer for SOFIA. In: Melugin RK, Roeser H-P, editors. Proc. SPIE. Vol 4014. SPIE; 2000. p. 195–202.
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Gerecht E, Musante CF, Zhuang Y, Ji M, Yngvesson KS, Goyette T, et al. NbN hot electron bolometric mixer with intrinsic receiver noise temperature of less than five times the quantum noise limit. In: Proc. IMS. Vol 2.; 2000. p. 1007–10.
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