Yagoubov P, Gol'tsman G, Voronov B, Svechnikov S, Cherednichenko S, Gershenzon E, et al. Quasioptical phonon-cooled NbN hot-electron bolometer mixer at THz frequencies. In: Proc. 7th Int. Symp. Space Terahertz Technol.; 1996. p. 303–17.
Abstract: In our experiments we tested phonon-cooled hot-electron bolometer (HEB) quasioptical mixer based on spiral antenna designed for 0.5-1.2 THz frequency band and fabricated on sapphire, Si-coated sapphire and high resistivity silicon substrates. HEB devices were produced from thin superconducting NbN film 3.5-6 nm thick with the critical temperature of about 11-12 K. For these devices we achieved the receiver noise temperature T R (DSB) = 3000 K in the 500-700 GHz frequency range and an IF bandwidth of 3-4 GHz. Prelimanary measurements at frequencies 1-1.2 THz resulted the receiver noise temperature about 9000 K (DSB).
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Semenov AD, Sergeev AV, Kouminov P, Goghidze IG, Heusinger MA, Nebosis RS, et al. Transparency of YBCO film/substrate interfaces for thermal phonons determined by photoresponse measurements. In: Freyhardt HC, editor. Proc. 1st European Conf. on Appl. Supercond. Vol 2.; 1993. p. 1443–6.
Abstract: Direct measurements of the thermal boundary resistance were performed by means of the stationary method. In this approach the temperature of an electrically heated film is controlled by its dc resistance while an additional film on the same substrate is used as a thermometer monitoring substrate temperature. The temperature field in the substrate is then calculated to deduce the Kapitza temperature step at the interface between the heated strip and the substrate. The main statement of all afore-said papers is that experimental values of the thermal boundary resistance are too large to be explained by the acoustic mismatch model. In this paper we investigate transparency of YBaCuO film/substrate interfaces for thermal phonons by means of photoresponse measurements. We show that our data are in reasonable agreement with the acoustic mismatch theory.
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Gol’tsman GN, Semenov AD, Sergeev AV, Aksaev EE, Gogidze IG, Gershenzon EM. Electron-phonon interaction in thin YBaCuO films and fast detectors. In: Meissner M, Pohl RO, editors. Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences. Vol 112.; 1993. p. 184–5.
Abstract: The thin. YBaCuO film response to laser and submillimeter radiation demonstrates the picosecond nonequilibrium peak on the nanosecond bolometric background. Experimental data give an evidence for the spectral dependence of picosecond photoresponse probably due to a poor efficiency of electron multiplication processes. Presented results prove an availability of fast YBaCuO thin film detector.
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Heusinger MA, Nebosis RS, Schatz W, Renk KF, Gol’tsman GN, Karasik BS, et al. Temperature dependence of bolometric and non-bolometric photoresponse of a structured YBa2Cu3O7-δ thin film. In: Meissner M, Pohl RO, editors. Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences. Vol 112.; 1993. p. 193–5.
Abstract: We investigated the temperature dependence of the transient voltage photoresponse of a current biased structured YBa2Cu3O7−δ thin film in its transition temperature region, around 79 K. Both, picosecond nonbolometric and nanosecond bolometric response to ultrashort far-infrared laser pulses were found for frequencies between 25 cm−1 and 215 cm−1. We will discuss optimum conditions for radiation detection and present an analysis of the dynamical behaviour of excited high T c thin films.
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Sergeev AV, Aksaev EE, Gogidze IG, Gol’tsman GN, Semenov AD, Gershenzon EM. Thermal boundary resistance at YBaCuO film-substrate interface. In: Meissner M, Pohl RO, editors. Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences. Vol 112.; 1993. p. 405–6.
Abstract: The nanosecond voltage response of YBaCuo films on Al2O3, MgO and ZrO2 substrates to electromagnetic radiation of millimeter and visible ranges has been investigated. The analysis of experimental conditions for Al2O3 and MgO substrates shows that the resistance change is monitored by the Kapitza boundary shift of temperature during the temporal interval ~ 100 ns limited by the time of phonon return from a substrate into a film. The observed exponential voltage decay is described by the phonon escape time which is proportional to the film thickness and is weakly temperature dependent.
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