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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Seki T, Shibata H, Takesue H, Tokura Y, Imoto N. Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode. Phys C. 2010;470(20):1534–7.
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Ferrari S, Kovalyuk V, Hartmann W, Vetter A, Kahl O, Lee C, et al. Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors. Opt Express. 2017;25(8):8739–50.
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Минаева ОВ. Быстродействующий однофотонный детектор на основе тонкой сверхпроводниковой пленки NbN [Ph.D. thesis].; 2009.
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Stucki D, Barreiro C, Fasel S, Gautier J-D, Gay O, Gisin N, et al. Continuous high speed coherent one-way quantum key distribution. Opt Express. 2009;17(16):13326–34.
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