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Gao JR, Hajenius M, Tichelaar FD, Voronov B, Grishina E, Klapwijk TM, et al. Can NbN films on 3C-SiC/Si change the IF bandwidth of hot electron bolometer mixers? In: Proc. 17th Int. Symp. Space Terahertz Technol.; 2006. p. 187–9.
Abstract: We realized ultra thin NbN films sputtered grown on a 3C-SiC/Si substrate. The film with a thickness of 3.5-4.5 nm shows a 1', of 11.8 K, which is the highest I`, observed among ultra thin NbN films on different substrates. The high-resolution transmission electron microscopy (HRTEM) studies show that the film has a monocrystalline structure, confirming the epitaxial growth on the 3C-SiC. Based on a two-temperature model and input parameters from standard NbN films on Si, simulations predict that the new film can increase the IF bandwidth of a HEB mixer by about a factor of 2 in comparison to the standard films. In addition, we find standard NbN films on Si with a T c of 9.4 K have a thickness of around 5.5 nm, being thicker than expected (3.5 nm).
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Yagoubov P, Hoogeveen R, Torgashin M, Khudchenko A, Koshelets V, Suttiwong N, et al. 550-650 GHz spectrometer development for TELIS. In: Proc. 17th Int. Symp. Space Terahertz Technol.; 2006. p. 338–41.
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Semenov A, Il'yin K, Siegel M, Smirnov A, Pavlov S, Richter H, et al. Intermediate frequency bandwidth of a hot-electron mixer: Comparision with bolometric models. In: Proc. 17th Int. Symp. Space Terahertz Technol. Paris, France; 2006. p. 73–6.
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