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Bremer, J. W.; Newhouse, V. L. |
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Journal Article |
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1958 |
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Phys. Rev. Lett. |
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282 |
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Bremer, J. W.; Newhouse, V. L. |
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MSPU @ s @ bremer_prl_1958 |
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215 |
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Korneeva, Y. P.; Vodolazov, D. Y.; Semenov, A. V.; Florya, I. N.; Simonov, N.; Baeva, E.; Korneev, A. A.; Goltsman, G. N.; Klapwijk, T. M. |
![goto web page (via DOI) doi](img/doi.gif)
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Title |
Optical single-photon detection in micrometer-scale NbN bridges |
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Journal Article |
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2018 |
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Phys. Rev. Applied |
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Phys. Rev. Applied |
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9 |
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6 |
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064037 (1 to 13) |
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NbN SSPD, SNSPD |
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We demonstrate experimentally that single-photon detection can be achieved in micrometer-wide NbN bridges, with widths ranging from 0.53 to 5.15 μm and for photon wavelengths of 408 to 1550 nm. The microbridges are biased with a dc current close to the experimental critical current, which is estimated to be about 50% of the theoretically expected depairing current. These results offer an alternative to the standard superconducting single-photon detectors, based on nanometer-scale nanowires implemented in a long meandering structure. The results are consistent with improved theoretical modeling based on the theory of nonequilibrium superconductivity, including the vortex-assisted mechanism of initial dissipation. |
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2331-7019 |
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1303 |
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Baeva, E. M.; Sidorova, M. V.; Korneev, A. A.; Smirnov, K. V.; Divochy, A. V.; Morozov, P. V.; Zolotov, P. I.; Vakhtomin, Y. B.; Semenov, A. V.; Klapwijk, T. M.; Khrapai, V. S.; Goltsman, G. N. |
![goto web page (via DOI) doi](img/doi.gif)
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Title |
Thermal properties of NbN single-photon detectors |
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Journal Article |
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2018 |
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Phys. Rev. Applied |
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Phys. Rev. Applied |
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6 |
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064063 (1 to 8) |
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NbN SSPD, SNSPD |
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We investigate thermal properties of a NbN single-photon detector capable of unit internal detection efficiency. Using an independent calibration of the coupling losses, we determine the absolute optical power absorbed by the NbN film and, via resistive superconductor thermometry, the temperature dependence of the thermal resistance Z(T) of the NbN film. In principle, this approach permits simultaneous measurement of the electron-phonon and phonon-escape contributions to the energy relaxation, which in our case is ambiguous because of the similar temperature dependencies. We analyze Z(T) with a two-temperature model and impose an upper bound on the ratio of electron and phonon heat capacities in NbN, which is surprisingly close to a recent theoretical lower bound for the same quantity in similar devices. |
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2331-7019 |
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1226 |
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Author |
Parker, W. H. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Modified heating theory of nonequilibrium superconductors |
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Journal Article |
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1975 |
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Phys. Rev. B |
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12 |
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9 |
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3667-3672 |
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American Physical Society |
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mht_Parker_1975 |
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221 |
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Saveskul, N. A.; Titova, N. A.; Baeva, E. M.; Semenov, A. V.; Lubenchenko, A. V.; Saha, S.; Reddy, H.; Bogdanov, S. I.; Marinero, E. E.; Shalaev, V. M.; Boltasseva, A.; Khrapai, V. S.; Kardakova, A. I.; Goltsman, G. N. |
![goto web page (via DOI) doi](img/doi.gif)
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Title |
Superconductivity behavior in epitaxial TiN films points to surface magnetic disorder |
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Journal Article |
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2019 |
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Phys. Rev. Applied |
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Phys. Rev. Applied |
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Volume ![sorted by Volume (numeric) field, ascending order (up)](img/sort_asc.gif) |
12 |
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5 |
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054001 |
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Keywords |
epitaxial TiN films |
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We analyze the evolution of the normal and superconducting properties of epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe an increase of the residual resistivity, that becomes dominated by diffusive surface scattering for d≤20nm. At the same time, a substantial thickness-dependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such high-quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of approximately 1012cm−2. Our results suggest that surface magnetic disorder is generally present in oxidized TiN films. |
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2331-7019 |
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1166 |
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