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Shangina EL, Smirnov KV, Morozov DV, Kovalyuk VV, Goltsman GN, Verevkin AA, et al. Concentration dependence of energy relaxation time in AlGaAs/GaAs heterojunctions: direct measurements. Semicond Sci Technol. 2011;26(2):025013.
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Gershenson EM, Gol'tsman GN, Elant'ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908–13.
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Blagosklonskaya LE, Gershenzon EM, Gol’tsman GN, Elant’ev AI. Effect of a strong magnetic field on the spectrum of donors in InSb. Sov Phys Semicond. 1978;11(12):1395–7.
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Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions. Presumably: Sov Phys Semicond | Физика и техника полупроводников. 1976;10:1379–83.
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Gershenzon EM, Goltsman GN, Ptitsyna NG. Investigation of excited donor states in GaAs. Sov Phys Semicond. 1974;7(10):1248–50.
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