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Baselmans, J. J. A.; Hajenius, M.; Gao, J. R.; Klapwijk, T. M.; de Korte, P. A. J.; Voronov, B.; Gol'tsman, G. |
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Doubling of sensitivity and bandwidth in phonon cooled hot electron bolometer mixers |
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2004 |
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Appl. Phys. Lett. |
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Appl. Phys. Lett. |
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84 |
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11 |
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1958-1960 |
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NbN HEB mixers |
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We demonstrate that the performance of NbN lattice cooled hot electron bolometer mixers depends strongly on the interface quality between the bolometer and the contact structure. We show experimentally that both the receiver noise temperature and the gain bandwidth can be improved by more than a factor of 2 by cleaning the interface and adding an additional superconducting interlayer to the contact pad. Using this we obtain a double sideband receiver noise temperature TN,DSB=950 K
at 2.5 THz and 4.3 K, uncorrected for losses in the optics. At the same bias point, we obtain an IF gain bandwidth of 6 GHz. |
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352 |
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Mason, Whitney; Waterman, J. R. |
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Electrical and optical characteristics of two color mid wave HgCdTe infrared detectors |
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1999 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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74 |
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11 |
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1633-1635 |
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0003-6951 |
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RPLAB @ s @ |
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461 |
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Zhang, W.; Khosropanah, P.; Gao, J. R.; Kollberg, E. L.; Yngvesson, K. S.; Bansal, T.; Barends, R.; Klapwijk, T. M. |
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Title |
Quantum noise in a terahertz hot electron bolometer mixer |
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Journal Article |
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2010 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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96 |
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11 |
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111113-(1-3) |
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HEB mixer, quantum limit, quantum noise, vacuum box, THz, Terahertz |
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We have measured the noise temperature of a single, sensitive superconducting NbN hot electron bolometer (HEB) mixer in a frequency range from 1.6 to 5.3 THz, using a setup with all the key components in vacuum. By analyzing the measured receiver noise temperature using a quantum noise (QN) model for HEB mixers, we confirm the effect of QN. The QN is found to be responsible for about half of the receiver noise at the highest frequency in our measurements. The beta-factor (the quantum efficiency of the HEB) obtained experimentally agrees reasonably well with the calculated value. |
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Terai, Hirotaka; Miki, Shigehito; Yamashita, Taro; Makise, Kazumasa; Wang, Zhen |
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Demonstration of single-flux-quantum readout operation for superconducting single-photon detectors |
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2010 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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97 |
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11 |
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3 |
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SSPD |
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A readout circuit using superconducting single-flux-quantum (SFQ) circuits has been developed to realize an independently addressable array of superconducting single-photon detectors (SSPDs). We tested the SFQ readout circuits by connecting with SSPDs. The error rates of readout circuits were below 10–5 for input signal amplitude of greater than 18.2 μA. Detection efficiencies (DEs) for single-photon incidents were measured both with and without the connection of a readout circuit. The observed DEs traced almost the same curves regardless of the connection of the readout circuit, except that the SSPD is likely to latch by connecting the readout circuit. |
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RPLAB @ gujma @ |
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654 |
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Kerman, A. J.; Dauler, E. A.; Keicher, W. E.; Yang, J. K. W.; Berggren, K. K.; Gol’tsman, G.; Voronov, B. |
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Kinetic-inductance-limited reset time of superconducting nanowire photon counters |
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2006 |
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Appl. Phys. Lett. |
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Appl. Phys. Lett. |
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88 |
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11 |
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111116 (1 to 3) |
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NbN SSPD, SNSPD |
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We investigate the recovery of superconducting NbN-nanowire photon counters after detection of an optical pulse at a wavelength of 1550nm, and present a model that quantitatively accounts for our observations. The reset time is found to be limited by the large kinetic inductance of these nanowires, which forces a tradeoff between counting rate and either detection efficiency or active area. Devices of usable size and high detection efficiency are found to have reset times orders of magnitude longer than their intrinsic photoresponse time.
The authors acknowledge D. Oates and W. Oliver (MIT Lincoln Laboratory), S.W. Nam, A. Miller, and R. Hadfield (NIST) and R. Sobolewski, A. Pearlman, and A. Verevkin (University of Rochester) for helpful discussions and technical assistance. This work made use of MIT’s shared scanning-electron-beam-lithography facility in the Research Laboratory of Electronics. This work is sponsored by the United States Air Force under Air Force Contract No. FA8721-05-C-0002. Opinions, interpretations, recommendations and conclusions are those of the authors and are not necessarily endorsed by the United States Government. |
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