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Author Siddiqi, I.; Prober, D. E. url  doi
openurl 
  Title Nb–Au bilayer hot-electron bolometers for low-noise THz heterodyne detection Type Journal Article
  Year 2004 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 84 Issue 8 Pages 1404  
  Keywords HEB, mixers, dynamic range, saturation, LO power, local oscillator power, Nb  
  Abstract The sensitivity of present Nb diffusion-cooled hot-electron bolometer (HEB) mixers is not quantum limited, and can be improved by reducing the superconducting transition temperature TC. Lowering TC reduces thermal fluctuations, resulting in a decrease of the mixer noise temperature TM. However, lower TC mixers have reduced dynamic range and saturate more easily due to background noise. We present 30 GHz microwave measurements on a bilayer HEB system, Nb–Au, in which TC can be tuned with Au layer thickness to obtain the maximum sensitivity for a given noise background. These measurements are intended as a guide for the optimization of THz mixers. Using a Nb–Au mixer with TC = 1.6 K, we obtain TM = 50 K with 2 nW of local oscillator (LO) power. Good mixer performance is observed over a wide range of LO power and bias voltage and such a device should not exhibit saturation in a THz receiver.  
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  ISSN 0003-6951 ISBN Medium  
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  Notes Approved no  
  Call Number Serial 571  
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Author Korneev, A.; Kouminov, P.; Matvienko, V.; Chulkova, G.; Smirnov, K.; Voronov, B.; Gol'tsman, G. N.; Currie, M.; Lo, W.; Wilsher, K.; Zhang, J.; Słysz, W.; Pearlman, A.; Verevkin, A.; Sobolewski, Roman url  doi
openurl 
  Title Sensitivity and gigahertz counting performance of NbN superconducting single-photon detectors Type Journal Article
  Year 2004 Publication Appl. Phys. Lett. Abbreviated Journal Appl. Phys. Lett.  
  Volume 84 Issue 26 Pages 5338-5340  
  Keywords SSPD, NEP, QE  
  Abstract We have measured the quantum efficiencysQEd, GHz counting rate, jitter, and noise-equivalentpowersNEPdof nanostructured NbN superconducting single-photon detectorssSSPDsdin thevisible to infrared radiation range. Our 3.5-nm-thick and 100- to 200-nm-wide meander-typedevices(total area 10310mm2), operating at 4.2 K, exhibit an experimental QE of up to 20% inthe visible range and,10% at 1.3 to 1.55mm wavelength and are potentially sensitive up tomidinfrareds,10mmdradiation. The SSPD counting rate was measured to be above 2 GHz withjitter,18 ps, independent of the wavelength. The devices’ NEP varies from,10−17W/Hz1/2for1.55mm photons to,10−20W/Hz1/2for visible radiation. Lowering the SSPD operatingtemperature to 2.3 K significantly enhanced its performance, by increasing the QE to,20% andlowering the NEP level to,3310−22W/Hz1/2, both measured at 1.26mm wavelength.  
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  Notes Approved no  
  Call Number Serial 532  
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Author Zwiller, V.; Aichele, T.; Seifert, W.; Persson, J.; Benson, O. url  doi
openurl 
  Title Generating visible single photons on demand with single InP quantum dots Type Journal Article
  Year 2003 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 82 Issue 10 Pages 1509-1511  
  Keywords single photon, quantum dot, InP  
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  Notes Approved no  
  Call Number Serial 503  
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Author Ganzevles, W. F. M.; Gao, J. R.; de Korte, P. A. J.; Klapwijk, T. M. url  doi
openurl 
  Title Direct response of microstrip line coupled Nb THz hot-electron bolometer mixers Type Journal Article
  Year 2001 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 79 Issue 15 Pages 2483-2485  
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  Notes Approved no  
  Call Number Serial 311  
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Author Zwiller, Vale<cc><81>ry; Blom, Hans; Jonsson, Per; Panev, Nikolay; Jeppesen, Sören; Tsegaye, Tedros; Goobar, Edgard; Pistol, Mats-Erik; Samuelson, Lars; Björk, Gunnar url  doi
openurl 
  Title Single quantum dots emit single photons at a time: Antibunching experiments Type Journal Article
  Year 2001 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 78 Issue 17 Pages 2476  
  Keywords antibunching, quantum dot  
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  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 502  
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