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Author Gershenzon, E. M.; Gol'tsman, G. N.; Kagane, M. L.
Title Observation of free carrier resonances in p-type germanium at submillimeter wavelengths Type Journal Article
Year 1978 Publication (down) Sov. Phys. Solid State Abbreviated Journal Sov. Phys. Solid State
Volume 20 Issue 4 Pages 573-579
Keywords p-Ge, free carriers, resonances
Abstract The spectrum of hole resonances in pure p-Ge for submillimetre in quantizing magnetic fields has been studied and identified. Measurements of photoconductivity spectra of p-Ge were made in the wave range lambda = 2-0.3 mm at temp. of 4.2-15 deg K in magnetic fields H up to 40 Measurements at various frequencies showed that the position of a series of characteristic resonances depends on the frequency of the illumination. This is in line with theoretical conclusions about the effective mass of the carriers increasing with rise in the magnetic field as a result of the interaction of the edge of the valency band with the split spin-orbital interaction of the sub 7 exp + band and the conduction band. The relative intensity of the quantum resonance lines of the free holes depends on the excitation conditions.
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Call Number Serial 1721
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Author Gershenzon, E. M.; Goltsman, G. N.
Title Zeeman effect in excited-states of donors in germanium Type Journal Article
Year 1972 Publication (down) Sov. Phys. Semicond. Abbreviated Journal Sov. Phys. Semicond.
Volume 6 Issue 3 Pages 509
Keywords Ge, donors, Zeeman effect
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Publisher Amer Inst Physics 1305 Walt Whitman Rd, Ste 300, Melville, Ny 11747-4501 Usa Place of Publication Editor
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Notes Approved no
Call Number Serial 1737
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Author Blagosklonskaya, L. E.; Gershenzon, E. M.; Gol’tsman, G. N.; Elant’ev, A. I.
Title Effect of a strong magnetic field on the spectrum of donors in InSb Type Journal Article
Year 1978 Publication (down) Sov. Phys. Semicond. Abbreviated Journal Sov. Phys. Semicond.
Volume 11 Issue 12 Pages 1395-1397
Keywords InSb, spectrum of donors, strong magnetic field
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Notes Approved no
Call Number Serial 1725
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Author Gershenzon, E. M.; Goltsman, G. N.; Ptitsyna, N. G.
Title Investigation of excited donor states in GaAs Type Journal Article
Year 1974 Publication (down) Sov. Phys. Semicond. Abbreviated Journal Sov. Phys. Semicond.
Volume 7 Issue 10 Pages 1248-1250
Keywords GaAs, excited donor states
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Publisher Amer Inst Physics 1305 Walt Whitman Rd, Ste 300, Melville, Ny 11747-4501 Usa Place of Publication Editor
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Notes Approved no
Call Number Serial 1733
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Author Gershenzon, E. M.; Gershenzon, M. E.; Goltsman, G. N.; Lulkin, A.; Semenov, A. D.; Sergeev, A. V.
Title Electron-phonon interaction in ultrathin Nb films Type Journal Article
Year 1990 Publication (down) Sov. Phys. JETP Abbreviated Journal Sov. Phys. JETP
Volume 70 Issue 3 Pages 505-511
Keywords Nb films
Abstract A study was made of the heating of electrons in normal resistive states of superconducting thin Nb films. The directly determined relaxation time of the resistance of a sample and the rise of the electron temperature were used to find the electron-phonon interaction time rep,, The dependence of rep, on the mean free path of electrons re,, a 1-'demonstrated, in agreement with the theoretical predictions, that the contribution of the inelastic scattering of electrons by impurities to the energy relaxation process decreased at low temperatures and the observed temperature dependence rep, a T 2 was due to a modification of the phonon spectrum in thin fllms.

1. Much new information on the electron-phonon interaction time?;,, in thin films of normal metals and superconductors has been published recently. This information has been obtained mainly as a result of two types of measurement. One includes experiments on weak electron localization investigated by the method of quantum interference corrections to the conductivity of disordered conductors, which can be used to find the relaxation time T, of the phase of the electron wave function. In the absence of the scattering of electrons by paramagnetic impurities the relaxation time T, is associated with the most effective process of energy relaxation: T;= TL+ rep;, where T,, is the electronelectron relaxation time. At low temperatures, when the dependence T; a T is exhibited by thin disordered films, the dominant channel is that of the electron-electron relaxation and there is a lower limit to the temperature range in which rep, can be investigated.
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Notes Approved no
Call Number Serial 241
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