| Records |
| Author |
Karasik, B. S.; Elantiev, A. I. |
| Title |
Noise temperature limit of a superconducting hot-electron bolometer mixer |
Type |
Journal Article |
| Year |
1996 |
Publication |
Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
| Volume |
68 |
Issue |
6 |
Pages |
853-855 |
| Keywords |
HEB mixer noise temperature, Johnson noise, thermal fluctuation noise, noise bandwidth |
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| ISSN |
0003-6951 |
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260 |
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| Author |
Karasik, B. S.; Il'in, K. S.; Pechen, E. V.; Krasnosvobodtsev, S. I. |
| Title |
Diffusion cooling mechanism in a hot-electron NbC microbolometer mixer |
Type |
Journal Article |
| Year |
1996 |
Publication |
Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
| Volume |
68 |
Issue |
16 |
Pages |
2285-2287 |
| Keywords |
HEB mixer, diffusion cooling channel, diffusion channel |
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0003-6951 |
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no |
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262 |
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Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; LeDuc, H. G. |
| Title |
Mixing and noise in diffusion and phonon cooled superconducting hot-electron bolometers |
Type |
Journal Article |
| Year |
1999 |
Publication |
J. Appl. Phys. |
Abbreviated Journal |
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| Volume |
85 |
Issue |
3 |
Pages |
1644-1653 |
| Keywords |
HEB, mixer |
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0021-8979 |
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556 |
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Elant'ev, A. I.; Karasik, B. S. |
| Title |
Effect of high-frequency current on Nb superconductive film in resistive state |
Type |
Journal Article |
| Year |
1989 |
Publication |
Sov. J. Low Temp. Phys. |
Abbreviated Journal |
Sov. J. Low Temp. Phys. |
| Volume |
15 |
Issue |
7 |
Pages |
379-383 |
| Keywords |
Nb HEB |
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882 |
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Il’in, K.S.; Ptitsina, N.G.; Sergeev, A.V.; Gol’tsman, G.N.; Gershenzon, E.M.; Karasik, B.S.; Pechen, E.V.; Krasnosvobodtsev, S.I. |
| Title |
Interrelation of resistivity and inelastic electron-phonon scattering rate in impure NbC films |
Type |
Journal Article |
| Year |
1998 |
Publication |
Phys. Rev. B |
Abbreviated Journal |
Phys. Rev. B |
| Volume |
57 |
Issue |
24 |
Pages |
15623-15628 |
| Keywords |
NbC films |
| Abstract |
A complex study of the electron-phonon interaction in thin NbC films with electron mean free path l=2–13nm gives strong evidence that electron scattering is significantly modified due to the interference between electron-phonon and elastic electron scattering from impurities. The interference T2 term, which is proportional to the residual resistivity, dominates over the Bloch-Grüneisen contribution to resistivity at low temperatures up to 60 K. The electron energy relaxation rate is directly measured via the relaxation of hot electrons heated by modulated electromagnetic radiation. In the temperature range 1.5–10 K the relaxation rate shows a weak dependence on the electron mean free path and strong temperature dependence ∼Tn, with the exponent n=2.5–3. This behavior is explained well by the theory of the electron-phonon-impurity interference taking into account the electron coupling with transverse phonons determined from the resistivity data. |
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0163-1829 |
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1585 |
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