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Author Romijn, J.; Klapwijk, T. M.; Renne, M. J.; Mooij, J. E. doi  openurl
  Title Critical pair-breaking current in superconducting aluminum strips far below Tc Type Journal Article
  Year (up) 1982 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B  
  Volume 26 Issue 7 Pages 3648-3655  
  Keywords superconducting nanowire  
  Abstract Critical currents of narrow, thin aluminum strips have been measured as a function of temperature. For the smallest samples uniformity of the current density is obtained over a large temperature range. Hence the intrinsic limit on the currentcarrying capacity of the superconductor was measured outside the Ginzburg-Landau -regime. The experimental values are compared with recent theoretical predictions by Kupriyanov and Lukichev. An approximate method of solving their equations is given, the results of which agree with the exact solution to within 1%. Experimental data are in excellent agreement with theoretical predictions. The absolute values agree if one assumes a ρl value of 4×10–16 Ωm2 with vF=1.3×106 m/s. This value for ρl is the same as that found from measurements of the anomalous skin effect but differs from values extracted from size-effect-limited resistivity.  
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  Notes Recommended by Klapwijk Approved no  
  Call Number Serial 925  
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Author Heslinga, D. R.; Shafranjuk, S. E.; van Kempen, H.; Klapwijk, T. M. url  doi
openurl 
  Title Observation of double-gap-edge Andreev reflection at Si/Nb interfaces by point-contact spectroscopy Type Journal Article
  Year (up) 1994 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B  
  Volume 49 Issue 15 Pages 10484-10494  
  Keywords Nb, Si, Nb-Si, Nb/Si, Si/Nb, Andreev reflection, point-contact spectroscopy  
  Abstract Andreev reflection point-contact spectroscopy is performed on a bilayer consisting of 50-nm degenerately doped Si backed with Nb. Due to the short mean free path both injection into and transport across the Si layer are diffusive, in contrast to the ballistic conditions prevailing in clean metal layers. Nevertheless a large Andreev signal is observed in the point-contact characteristics, not reduced by elastic scattering in the Si layer or by interface scattering, but only limited by the transmission coefficient of the metal-semiconductor point contact. Two peaks in the Andreev reflection probability are visible, marking the values of the superconducting energy gap at the interface on the Nb and Si sides. This interpretation is supported by a method of solving the Bogolubov equations analytically using a simplified expression for the variation of the order parameter close to the interface. This observation enables a comparison with theoretical predictions of the gap discontinuity in the proximity effect. It is found that the widely used de Gennes model does not agree with the experimental data.  
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  Publisher American Physical Society Place of Publication Editor  
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  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 1005  
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Author de Lange, G.; Kuipers, J. J.; Klapwijk, T. M.; Panhuyzen, R. A.; van de Stadt, H.; de Graauw, M. W. M. openurl 
  Title Superconducting resonator circuits at frequencies above the gap frequency Type Journal Article
  Year (up) 1995 Publication J. Appl. Phys. Abbreviated Journal  
  Volume 77 Issue 4 Pages 1795-1804  
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  Notes Approved no  
  Call Number Serial 257  
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Author Floet, D. Wilms; Baselmans, J. J. A.; Klapwijk, T. M.; Gao, J. R. url  doi
openurl 
  Title Resistive transition of niobium superconducting hot-electron bolometer mixers Type Journal Article
  Year (up) 1998 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 73 Issue 19 Pages 2826  
  Keywords HEB  
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  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0003-6951 ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 543  
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Author Ganzevles, W. F. M.; Gao, J. R.; de Korte, P. A. J.; Klapwijk, T. M. url  doi
openurl 
  Title Direct response of microstrip line coupled Nb THz hot-electron bolometer mixers Type Journal Article
  Year (up) 2001 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 79 Issue 15 Pages 2483-2485  
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  ISSN 0003-6951 ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 311  
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