| Records |
| Author |
Svechnikov, S. I.; Antipov, S. V.; Vakhtomin, Y. B.; Goltsman, G. N.; Gershenzon, E. M.; Cherednichenko, S. I.; Kroug, M.; Kollberg, E. |
| Title |
Conversion and noise bandwidths of terahertz NbN hot-electron bolometer mixers |
Type |
Journal Article |
| Year |
2001 |
Publication |
Physics of Vibrations |
Abbreviated Journal |
Physics of Vibrations |
Volume  |
9 |
Issue |
3 |
Pages |
205-210 |
| Keywords |
NbN HEB mixers |
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Edition |
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| ISSN |
1069-1227 |
ISBN |
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no |
| Call Number |
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Serial |
1551 |
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| Author |
Yagoubov, P.; Kroug, M.; Merkel, H.; Kollberg, E.; Schubert, J.; Hubers, H.-W.; Schwaab, G.; Gol'tsman, G.; Gershenzon, E. |
| Title |
Heterodyne measurements of a NbN superconducting hot electron mixer at terahertz frequencies |
Type |
Journal Article |
| Year |
1999 |
Publication |
IEEE Trans. Appl. Supercond. |
Abbreviated Journal |
IEEE Trans. Appl. Supercond. |
| Volume |
9 |
Issue |
2 |
Pages |
3757-3760 |
| Keywords |
NbN HEB mixers |
| Abstract |
The performance of a NbN based phonon-cooled Hot Electron Bolometric (HEB) quasioptical mixer is investigated in the 0.65-3.12 THz frequency range. The device is made from a 3 nm thick NbN film on high resistivity Si and integrated with a planar spiral antenna on the same substrate. The in-plane dimensions of the bolometer strip are 0.2/spl times/2 /spl mu/m. The best results of the DSB noise temperature at 1.5 GHz IF frequency obtained with one device are: 1300 K at 650 GHz, 4700 K at 2.5 THz and 10000 K at 3.12 THz. The measurements were performed at 4.5 K ambient temperature. The amount of local oscillator (LO) power absorbed in the bolometer is about 100 nW. The mixer is linear to within 1 dB compression up to the signal level 10 dB below that of the LO. The intrinsic single sideband conversion gain measured at 650 GHz is -9 dB, the total conversion gain is -14 dB. |
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| ISSN |
1051-8223 |
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Approved |
no |
| Call Number |
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Serial |
1569 |
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| Author |
Kroug, M.; Yagoubov, P.; Gol'tsman, G.; Kollberg, E. |
| Title |
NbN quasioptical phonon cooled hot electron bolometric mixers at THz frequencies |
Type |
Conference Article |
| Year |
1997 |
Publication |
Inst. Phys. Conf. Ser. |
Abbreviated Journal |
Inst. Phys. Conf. Ser. |
| Volume |
1 |
Issue |
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Pages |
405-408 |
| Keywords |
NbN HEB mixers |
| Abstract |
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| Address |
Veldhoven |
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Place of Publication |
Bristol |
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| ISSN |
0951-3248 |
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Conference |
3rd Eur. Conf. on Applied Superconductivity |
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no |
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Serial |
1600 |
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| Author |
Merkel, H. F.; Yagoubov, P. A.; Kroug, M.; Khosropanah, P.; Kollberg, E. L.; Gol’tsman, G. N.; Gershenzon, E. M. |
| Title |
Noise temperature and absorbed LO power measurement methods for NbN phonon-cooled hot electron bolometric mixers at terahertz frequencies |
Type |
Conference Article |
| Year |
1998 |
Publication |
Proc. 28th European Microwave Conf. |
Abbreviated Journal |
Proc. 28th European Microwave Conf. |
| Volume |
1 |
Issue |
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Pages |
294-299 |
| Keywords |
NbN HEB mixers |
| Abstract |
In this paper the absorbed LO power requirements and the noise performance of NbN based phonon-cooled hot electron bolometric (HEB) quasioptical mixers are investigated for RF frequencies in the 0.55-1.1 range The minimal measured DSB noise temperatures are about 500 K at 640 GHz, 600 K at 750 GHz, 850 K at 910 GHz and 1250 K at 1.1 THz. The increase in noise temperature at 1.1THz is attributed to water absorption. The absorbed LO power is measured using a calorimetric approach. The results are subsequently corrected for lattice heating. These values are compared to results of a novel one dimensional hot spot mixer models and to a more traditional isotherm method which tends to underestimate the absorbed LO power for small bias powers. Typically a LO power between 50nW and 100nW is needed to pump the device to the optimal operating point. |
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Conference |
28th European Microwave Conference |
| Notes |
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Approved |
no |
| Call Number |
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Serial |
1580 |
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| Author |
Kroug, M. |
| Title |
Hot electron bolometric mixers for a quasi-optical terahertz receiver |
Type |
Book Whole |
| Year |
2001 |
Publication |
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Abbreviated Journal |
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Issue |
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Pages |
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Thesis |
Ph.D. thesis |
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Place of Publication |
Chalmers University of Technology, Gothenburg, Sweden |
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no |
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Serial |
310 |
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