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Author (up) Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; LeDuc, H. G. url  doi
openurl 
  Title Mixing and noise in diffusion and phonon cooled superconducting hot-electron bolometers Type Journal Article
  Year 1999 Publication J. Appl. Phys. Abbreviated Journal  
  Volume 85 Issue 3 Pages 1644-1653  
  Keywords HEB, mixer  
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  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0021-8979 ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 556  
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Author (up) Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; Leduc, H. G. openurl 
  Title Spectrum of thermal fluctuation noise in diffusion and phonon cooled hot-electron mixers Type Journal Article
  Year 1998 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 72 Issue 12 Pages 1516-1518  
  Keywords HEB mixer; thermal fluctuation noise; TFN  
  Abstract A systematic study of the intermediate frequency noise bandwidth of Nb thin-film superconducting hot-electron bolometers is presented. We have measured the spectrum of the output noise as well as the conversion efficiency over a very broad intermediate frequency range (from 0.1 to 7.5 GHz) for devices varying in length from 0.08 μm to 3 μm. Local oscillator and rf signals from 8 to 40 GHz were used. For a device of a given length, the spectrum of the output noise and the conversion efficiency behave similarly for intermediate frequencies less than the gain bandwidth, in accordance with a simple thermal model for both the mixing and thermal fluctuation noise. For higher intermediate frequencies the conversion efficiency decreases; in contrast, the noise decreases but has a second contribution which dominates at higher frequency. The noise bandwidth is larger than the gain bandwidth, and the mixer noise is low, between 120 and 530 K (double side band).  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 760  
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Author (up) Johnson, B. R.; Reed, M. D.; Houck, A. A.; Schuster, D. I.; Bishop, Lev S.; Ginossar, E.; Gambetta, J. M.; Dicarlo, L.; Frunzio, L.; Girvin, S. M.; Schoelkopf, R. J. openurl 
  Title Quantum non-demolition detection of single microwave photons in a circuit Type Journal Article
  Year 2010 Publication Nature Physics Abbreviated Journal Nat. Phys.  
  Volume 6 Issue 9 Pages 663-667  
  Keywords fromIPMRAS  
  Abstract Thorough control of quantum measurement is key to the development of quantum information technologies. Many measurements are destructive, removing more information from the system than they obtain. Quantum non-demolition (QND) measurements allow repeated measurements that give the same eigenvalue. They could be used for several quantum information processing tasks such as error correction, preparation by measurement and one-way quantum computing. Achieving QND measurements of photons is especially challenging because the detector must be completely transparent to the photons while still acquiring information about them. Recent progress in manipulating microwave photons in superconducting circuits has increased demand for a QND detector that operates in the gigahertz frequency range. Here we demonstrate a QND detection scheme that measures the number of photons inside a high-quality-factor microwave cavity on a chip. This scheme maps a photon number, n, onto a qubit state in a single-shot by means of qubit-photon logic gates. We verify the operation of the device for n=0 and 1 by analysing the average correlations of repeated measurements, and show that it is 90% QND. It differs from previously reported detectors because its sensitivity is strongly selective to chosen photon number states. This scheme could be used to monitor the state of a photon-based memory in a quantum computer.  
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  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 806  
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