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Author (up) Fedder, H.; Oesterwind, S.; Wick, M.; Olbrich, F.; Michler, P.; Veigel, T.; Berroth, M.; Schlagmüller, M.
Title Characterization of electro-optical devices with low jitter single photon detectors – towards an optical sampling oscilloscope beyond 100 GHz Type Conference Article
Year 2018 Publication ECOC Abbreviated Journal
Volume Issue Pages 1-3
Keywords SSPD, SNSPD, SPAD
Abstract We showcase an optical random sampling scope that exploits single photon counting and apply it to characterize optical transceivers. We study single photon detectors with a jitter down to 40 ps. The method can be extended beyond 100 GHz.
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Call Number 8535415 Serial 1198
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Author (up) Santhanam, P.; Wind, S.; Prober, D. E.
Title Localization, superconducting fluctuations, and superconductivity in thin films and narrow wires of aluminum Type Journal Article
Year 1987 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B
Volume 35 Issue 7 Pages 3188-3206
Keywords Al films; electron-phonon scattering; electron-electron scattering; Disordered structures; amorphous and glassy solids, Relaxation times and mean free paths, Galvanomagnetic and other magnetotransport effects
Abstract We report a comprehensive set of experiments on wide and narrow thin-film strips of aluminum which test the predictions of recent localization theory. The experiments on wide films in the two-dimensional regime confirm the theoretical predictions and also yield insight into inelastic mechanisms and spin-orbit scattering rates. Our extension of the existing theory for one-dimensional systems to include spin-orbit scattering and Maki-Thompson superconducting fluctuations is verified by the experiments. We find clear evidence for one-dimensional localization, with inferred inelastic rates identical to those in two-dimensional films. The prediction of the localization theory for a dimensional crossover from two-dimensional to one-dimensional behavior is also confirmed. We have reanalyzed the results of some previous experiments on thin films and narrow wires in light of these results.
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Call Number RPLAB @ gujma @ Serial 757
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