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Tretyakov, I.; Svyatodukh, S.; Chumakova, A.; Perepelitsa, A.; Kaurova, N.; Shurakov, A.; Zilberley, T.; Ryabchun, S.; Smirnov, M.; Ovchinnikov, O.; Goltsman, G. |
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Title |
Room temperature silicon detector for IR range coated with Ag2S quantum dots |
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Conference Article |
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Year |
2019 |
Publication |
IRMMW-THz |
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Keywords |
Ag2S quantum dots |
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Abstract |
A silicon has been the chief technological semiconducting material of modern microelectronics and has had a strong influence on all aspects of society. Applications of Si-based optoelectronic devices are limited to the visible and near infrared ranges. The expansion of the Si absorption to shorter wavelengths of the infrared range is of considerable interest to optoelectronic applications. By creating impurity states in Si it is possible to cause sub-band gap photon absorption. Here, we present an elegant and effective technology of extending the photoresponse of towards the IR range. Our approach is based on the use of Ag 2 S quantum dots (QDs) planted on the surface of Si. The specific sensitivity of the Ag 2 S/Si heterostructure is 10 11 cm√HzW -1 at 1.55μm. Our findings open a path towards the future study and development of Si detectors for technological applications. |
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2162-2035 |
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978-1-5386-8285-2 |
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Call Number |
8874267 |
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1286 |
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Author |
Finkel, M.; Thierschmann, H. R.; Galatro, L.; Katan, A. J.; Thoen, D. J.; de Visser, P. J.; Spirito, M.; Klapwijk, T. M. |
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Title |
Branchline and directional THz coupler based on PECVD SiNx-technology |
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Conference Article |
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Year |
2016 |
Publication |
41st IRMMW-THz |
Abbreviated Journal |
41st IRMMW-THz |
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microstrip, fixtures, coplanar waveguides, couplers, standards, probes, dielectrics |
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Abstract |
A fabrication technology to realize THz microstrip lines and passive circuit components is developed and tested making use of a plasma-enhanced chemical vapor deposition grown silicon nitride (PECVD SiNx) dielectric membrane. We use 2 μm thick SiNx and 300 nm thick gold layers on sapphire substrates. We fabricate a set of structures for thru-reflect-line (TRL) calibration, with the reflection standard implemented as a short through the via. We find losses of 9.5 dB/mm at 300 GHz for a 50 Ohm line. For a branchline coupler we measure 2.5 dB insertion loss, 1 dB amplitude imbalance and 21 dB isolation. Good control over the THz lines parameters is proven by similar performance of a set of 5 structures. The directional couplers show -14 dB transmission to the coupled port, -24 dB to the isolated port and -25 dB in reflection. The SiNx membrane, used as a dielectric, is compatible with atomic force microscopy (AFM) cantilevers allowing the application of this technology to the development of a THz near-field microscope. |
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2162-2035 |
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978-1-4673-8485-8 |
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7758586 |
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1295 |
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Semenov, A. D.; Hübers, H.-W.; Gol’tsman, G. N.; Smirnov, K. |
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Title |
Superconducting quantum detector for astronomy and X-ray spectroscopy |
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Conference Article |
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Year |
2002 |
Publication |
Proc. Int. Workshop on Supercond. Nano-Electronics Devices |
Abbreviated Journal |
Proc. Int. Workshop on Supercond. Nano-Electronics Devices |
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201-210 |
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NbN SSPD, SNSPD, SQD, superconducting quantum detectors, X-ray spectroscopy |
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We propose the novel concept of ultra-sensitive energy-dispersive superconducting quantum detectors prospective for applications in astronomy and X-ray spectroscopy. Depending on the superconducting material and operation conditions, such detector may allow realizing background limited noise equivalent power 10−21 W Hz−1/2 in the terahertz range when exposed to 4-K background radiation or counting of 6-keV photon with almost 10—4 energy resolution. Planar layout and relatively simple technology favor integration of elementary detectors into a detector array. |
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Naples, Italy |
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Springer |
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Boston, MA |
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Pekola, J.; Ruggiero, B.; Silvestrini, P. |
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978-1-4615-0737-6 |
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International Workshop on Superconducting Nano-Electronics Devices, May 28-June 1, 2001 |
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no |
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Call Number |
semenov2002superconducting |
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1525 |
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Author |
Yagoubov, P.; Hübers, H.-W.; Gol’tsman, G.; Semenov, A.; Gao, J.; Hoogeveen, R.; de Graauw, T.; Birk, M.; Selig, A.; de Korte, P. |
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Title |
Hot-electron bolometer mixers – technology for far-infrared heterodyne instruments in future atmospheric chemistry missions |
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Conference Article |
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Year |
2001 |
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Proc. 3rd Int. Symp. Submillimeter Wave Earth Observation From Space |
Abbreviated Journal |
Proc. 3rd Int. Symp. Submillimeter Wave Earth Observation From Space |
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57-69 |
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HEB mixers |
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Delmenhorst |
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Logos-Verlag |
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Buehler, S.; Berlin |
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3-89722-700-2 |
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International Symposium on Submillimeter Wave Earth Observation from Space, ISSMWEOS01 |
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1549 |
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Author |
Semenov, A. D.; Sergeev, A. V.; Kouminov, P.; Goghidze, I. G.; Heusinger, M. A.; Nebosis, R. S.; Gol'tsman, G. N.; Gershenzon, E. M.; Renk, K. F. |
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Title |
Transparency of YBCO film/substrate interfaces for thermal phonons determined by photoresponse measurements |
Type |
Conference Article |
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Year |
1993 |
Publication |
Proc. 1st European Conf. on Appl. Supercond. |
Abbreviated Journal |
Proc. 1st European Conf. on Appl. Supercond. |
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2 |
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1443-1446 |
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Keywords |
YBCO HTS detectors |
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Abstract |
Direct measurements of the thermal boundary resistance were performed by means of the stationary method. In this approach the temperature of an electrically heated film is controlled by its dc resistance while an additional film on the same substrate is used as a thermometer monitoring substrate temperature. The temperature field in the substrate is then calculated to deduce the Kapitza temperature step at the interface between the heated strip and the substrate. The main statement of all afore-said papers is that experimental values of the thermal boundary resistance are too large to be explained by the acoustic mismatch model. In this paper we investigate transparency of YBaCuO film/substrate interfaces for thermal phonons by means of photoresponse measurements. We show that our data are in reasonable agreement with the acoustic mismatch theory. |
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Freyhardt, H. C. |
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3-88355-197-X |
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1st European conference on applied superconductivity |
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1661 |
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