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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
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PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
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Journal Article |
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2000 |
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Microelectronics Reliability |
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Microelectronics Reliability |
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40 |
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1353-1358 |
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SSPD, CMOS testing |
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Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors. |
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1054 |
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Author |
Stellari, Franco; Song, Peilin |
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Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
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2005 |
Publication |
Proc. 12th IPFA |
Abbreviated Journal |
Proc. 12th IPFA |
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2 |
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SSPD, CMOS testing |
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In F. Stellari and P. Song (2004) the authors have shown a comparison among different detectors used for diagnosing integrated circuits (ICs) by means of the PICA method. In their experiments they used two versions of the SSPD detector (p-SSPD is a prototype version, while c-SSPD is the first commercially available generation of the detector as presented in W. K. Lo et al. (2002), as well as the imaging detector (S-25 photo-multiplier tube (PMT) as discussed in W. G. McMullan (1987)) used in the conventional PICA technique. A microprocessor chip fabricated in a 0.13 μm 1.2 V technology is used to show that c-SSPD provides a significant reduction in acquisition time for the collection of optical waveforms from chips running at very low. In this paper, the authors summarize the main results. |
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IEEE |
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0-7803-9301-5 |
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1055 |
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Driessen, E. F. C.; Braakman, F. R.; Reiger, E. M.; Dorenbos, S. N.; Zwiller, V.; de Dood, M. J. A. |
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Impedance model for the polarization-dependent optical absorption of superconducting single-photon detectors |
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2009 |
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Eur. Phys. J. Appl. Phys. |
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47 |
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10701 |
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SSPD, SNSPD |
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We measured the single-photon detection efficiency of NbN superconducting single-photon detectors as a function of the polarization state of the incident light for different wavelengths in the range from 488 nm to 1550 nm. The polarization contrast varies from ~% at 488 nm to~0% at 1550 nm, in good agreement with numerical calculations. We use an optical-impedance model to describe the absorption for polarization parallel to the wires of the detector. For the extremely lossy NbN material, the absorption can be kept constant by keeping the product of layer thickness and filling factor constant. As a consequence, the maximum possible absorption is independent of filling factor. By illuminating the detector through the substrate, an absorption efficiency of ~0% can be reached for a detector on Si or GaAs, without the need for an optical cavity. |
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RPLAB @ alex_kazakov @ |
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1062 |
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Author |
Тархов, Михаил Александрович |
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Разработка сверхпроводниковых однофотонных детекторов с повышенной спектральной чувствительностью и быстродействием |
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2016 |
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М. НИЦ “Курчатовский институт” |
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1-103 |
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SSPD |
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123182, Россия, Москва, пл. Академика И. В. Курчатова, 1 |
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Ph.D. thesis |
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НИЦ "Курчатовский институт" |
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1064 |
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Тархов, Михаил Александрович |
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Разработка сверхпроводниковых однофотонных детекторов с повышенной спектральной чувствительностью и быстродействием. Автореферат |
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2016 |
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М. НИЦ “Курчатовский институт” |
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1-30 |
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SSPD |
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1065 |
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