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Author An, Zhenghua; Chen, Jeng-Chung; Ueda, T.; Komiyama, S.; Hirakawa, K.
Title Infrared phototransistor using capacitively coupled two-dimensional electron gas layers Type Journal Article
Year 2005 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.
Volume 86 Issue Pages 172106 - 172106-3
Keywords 2DEG
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Call Number RPLAB @ akorneev @ Serial 603
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Author Stevens, M.; Hadfield, R.; Schwall, R.; Nam, S.W.; Mirin, R.; Gupta, J.
Title Fast lifetime measurements of infrared emitters using a low-jitter superconduct- ing single-photon detector Type Journal Article
Year 2006 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.
Volume 89 Issue Pages 031109
Keywords SSPD, jitter, QD, QW
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Call Number RPLAB @ akorneev @ Serial 611
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Author Terai, Hirotaka; Miki, Shigehito; Yamashita, Taro; Makise, Kazumasa; Wang, Zhen
Title Demonstration of single-flux-quantum readout operation for superconducting single-photon detectors Type Journal Article
Year 2010 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.
Volume 97 Issue 11 Pages 3
Keywords SSPD
Abstract (up) A readout circuit using superconducting single-flux-quantum (SFQ) circuits has been developed to realize an independently addressable array of superconducting single-photon detectors (SSPDs). We tested the SFQ readout circuits by connecting with SSPDs. The error rates of readout circuits were below 10–5 for input signal amplitude of greater than 18.2 μA. Detection efficiencies (DEs) for single-photon incidents were measured both with and without the connection of a readout circuit. The observed DEs traced almost the same curves regardless of the connection of the readout circuit, except that the SSPD is likely to latch by connecting the readout circuit.
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Call Number RPLAB @ gujma @ Serial 654
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Author Burke, P. J.; Schoelkopf, R. J.; Prober, D. E.; Skalare, A.; Karasik, B. S.; Gaidis, M. C.; McGrath, W. R.; Bumble, B.; Leduc, H. G.
Title Spectrum of thermal fluctuation noise in diffusion and phonon cooled hot-electron mixers Type Journal Article
Year 1998 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.
Volume 72 Issue 12 Pages 1516-1518
Keywords HEB mixer; thermal fluctuation noise; TFN
Abstract (up) A systematic study of the intermediate frequency noise bandwidth of Nb thin-film superconducting hot-electron bolometers is presented. We have measured the spectrum of the output noise as well as the conversion efficiency over a very broad intermediate frequency range (from 0.1 to 7.5 GHz) for devices varying in length from 0.08 μm to 3 μm. Local oscillator and rf signals from 8 to 40 GHz were used. For a device of a given length, the spectrum of the output noise and the conversion efficiency behave similarly for intermediate frequencies less than the gain bandwidth, in accordance with a simple thermal model for both the mixing and thermal fluctuation noise. For higher intermediate frequencies the conversion efficiency decreases; in contrast, the noise decreases but has a second contribution which dominates at higher frequency. The noise bandwidth is larger than the gain bandwidth, and the mixer noise is low, between 120 and 530 K (double side band).
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Call Number RPLAB @ gujma @ Serial 760
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Author Fu, K.; Zannoni, R.; Chan, C.; Adams, S. H.; Nicholson, J.; Polizzi, E.; Yngvesson, K. S.
Title Terahertz detection in single wall carbon nanotubes Type Journal Article
Year 2008 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.
Volume 92 Issue 3 Pages 033105
Keywords HEB, single wall, carbon nanotube, CNT, SWNT, SWCNT, terahertz detection, THz
Abstract (up) It is reported that terahertz radiation from 0.69 to 2.54 THz has been sensitively detected in a device consisting of bundles of carbon nanotubes containing single wall metallic carbon nanotubes, quasioptically coupled through a lithographically fabricated antenna, and a silicon lens. The measured data are consistent with a bolometric detection process in the metallic tubes and the devices show promise for operation well above 4.2 K.
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ISSN 0003-6951 ISBN Medium
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Notes NEP is not shown Approved no
Call Number Serial 566
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