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Author Verevkin, A. A.; Ptitsina, N. G.; Chulcova, G. M.; Gol'Tsman, G. N.; Gershenzon, E. M.; Yngvesson, K. S. url  doi
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  Title Determination of the limiting mobility of a two-dimensional electron gas in AlxGa1-xAs/GaAs heterostructures and direct measurement of the energy relaxation time Type Journal Article
  Year 1996 Publication Phys. Rev. B Condens. Matter. Abbreviated Journal Phys. Rev. B Condens. Matter.  
  Volume 53 Issue 12 Pages R7592-R7595  
  Keywords 2DEG, AlGaAs/GaAs heterostructures  
  Abstract We present results for a method to measure directly the energy relaxation time (τe) for electrons in a single AlxGa1−xAs/GaAs heterojunction; measurements were performed from 1.6 to 15 K under quasiequilibrium conditions. We find τeαT−1 below 4 K, and τe independent of T above 4 K. We have also measured the energy-loss rate, ⟨Q⟩, by the Shubnikov-de Haas technique, and find ⟨Q⟩α(T3e−T3) for T<~4.2 K; Te is the electron temperature. The values and temperature dependence of τe and ⟨Q⟩ for T<4 K agree with calculations based on piezoelectric and deformation potential acoustic phonon scattering. At 4.2 K, we can also estimate the momentum relaxation time, τm, from our measured τe. This leads to a preliminary estimate of the phonon-limited mobility at 4.2 K of μ=3×107 cm2/Vs (ns=4.2×1011 cm−2), which agrees well with published numerical calculations, as well as with an earlier indirect estimate based on measurements on a sample with much higher mobility.  
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  ISSN 0163-1829 ISBN Medium  
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  Notes (up) PMID:9982274 Approved no  
  Call Number Serial 1612  
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Author Pekker, David; Shah, Nayana; Sahu, Mitrabhanu; Bezryadin, Alexey; Goldbart, Paul M. doi  openurl
  Title Stochastic dynamics of phase-slip trains and superconductive-resistive switching in current-biased nanowires Type Journal Article
  Year 2009 Publication Phys. Rev. B Abbreviated Journal  
  Volume 80 Issue Pages 214525 (1 to 17)  
  Keywords superconducting nanowire, phase-slip, order parameter, HEB distributed model, HEB model  
  Abstract Superconducting nanowires fabricated via carbon-nanotube templating can be used to realize and study quasi-one-dimensional superconductors. However, measurement of the linear resistance of these nanowires have been inconclusive in determining the low-temperature behavior of phase-slip fluctuations, both quantal and thermal. Thus, we are motivated to study the nonlinear current-voltage characteristics in current-biased nanowires and the stochastic dynamics of superconductive-resistive switching, as a way of probing phase-slip events. In particular, we address the question: can a single phase-slip event occurring somewhere along the wire—during which the order-parameter fluctuates to zero—induce switching, via the local heating it causes? We explore this and related issues by constructing a stochastic model for the time evolution of the temperature in a nanowire whose ends are maintained at a fixed temperature. We derive the corresponding master equation as a tool for evaluating and analyzing the mean switching time at a given value of current (smaller than the depairing critical current). The model indicates that although, in general, several phase-slip events are necessary to induce switching via a thermal runaway, there is indeed a regime of temperatures and currents in which a single event is sufficient. We carry out a detailed comparison of the results of the model with experimental measurements of the distribution of switching currents, and provide an explanation for the rather counterintuitive broadening of the distribution width that is observed upon lowering the temperature. Moreover, we identify a regime in which the experiments are probing individual phase-slip events, and thus offer a way of unearthing and exploring the physics of nanoscale quantum tunneling of the one-dimensional collective quantum field associated with the superconducting order parameter.  
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  Notes (up) Recommended by Klapwijk Approved no  
  Call Number Serial 923  
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Author Romijn, J.; Klapwijk, T. M.; Renne, M. J.; Mooij, J. E. doi  openurl
  Title Critical pair-breaking current in superconducting aluminum strips far below Tc Type Journal Article
  Year 1982 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B  
  Volume 26 Issue 7 Pages 3648-3655  
  Keywords superconducting nanowire  
  Abstract Critical currents of narrow, thin aluminum strips have been measured as a function of temperature. For the smallest samples uniformity of the current density is obtained over a large temperature range. Hence the intrinsic limit on the currentcarrying capacity of the superconductor was measured outside the Ginzburg-Landau -regime. The experimental values are compared with recent theoretical predictions by Kupriyanov and Lukichev. An approximate method of solving their equations is given, the results of which agree with the exact solution to within 1%. Experimental data are in excellent agreement with theoretical predictions. The absolute values agree if one assumes a ρl value of 4×10–16 Ωm2 with vF=1.3×106 m/s. This value for ρl is the same as that found from measurements of the anomalous skin effect but differs from values extracted from size-effect-limited resistivity.  
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  Notes (up) Recommended by Klapwijk Approved no  
  Call Number Serial 925  
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Author Huard, B.; Pothier, H.; Esteve, D.; Nagaev, K. E. url  doi
openurl 
  Title Electron heating in metallic resistors at sub-Kelvin temperature Type Journal Article
  Year 2007 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B  
  Volume 76 Issue Pages 165426(1-9)  
  Keywords electron heating in resistor, HEB distributed model, HEB model, hot electrons  
  Abstract In the presence of Joule heating, the electronic temperature in a metallic resistor placed at sub-Kelvin temperatures can significantly exceed the phonon temperature. Electron cooling proceeds mainly through two processes: electronic diffusion to and from the connecting wires and electron-phonon coupling. The goal of this paper is to present a general solution of the problem in a form that can easily be used in practical situations. As an application, we compute two quantities that depend on the electronic temperature profile: the second and the third cumulant of the current noise at zero frequency, as a function of the voltage across the resistor. We also consider time-dependent heating, an issue relevant for experiments in which current pulses are used, for instance, in time-resolved calorimetry experiments.  
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  Notes (up) Recommended by Klapwijk as example for writing the article on the HEB model. Approved no  
  Call Number Serial 936  
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Author Bulaevskii, L. N.; Graf, M. J.; Batista, C. D.; Kogan, V. G. openurl 
  Title Vortex-induced dissipation in narrow current-biased thin-film superconducting strips Type Journal Article
  Year 2011 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B  
  Volume 83 Issue 14 Pages 9  
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  Abstract A vortex crossing a thin-film superconducting strip from one edge to the other, perpendicular to the bias current, is the dominant mechanism of dissipation for films of thickness d on the order of the coherence length ξ and of width w much narrower than the Pearl length Λâ‰<ab>wâ‰<ab>ξ. At high bias currents I*<I<Ic the heat released by the crossing of a single vortex suffices to create a belt-like normal-state region across the strip, resulting in a detectable voltage pulse. Here Ic is the critical current at which the energy barrier vanishes for a single vortex crossing. The belt forms along the vortex path and causes a transition of the entire strip into the normal state. We estimate I* to be roughly Ic/3. Furthermore, we argue that such “hot” vortex crossings are the origin of dark counts in photon detectors, which operate in the regime of metastable superconductivity at currents between I* and Ic. We estimate the rate of vortex crossings and compare it with recent experimental data for dark counts. For currents below I*, that is, in the stable superconducting but resistive regime, we estimate the amplitude and duration of voltage pulses induced by a single vortex crossing.  
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  Notes (up) SSPD Approved no  
  Call Number RPLAB @ gujma @ Serial 688  
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