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Gao, J. R.; Hajenius, M.; Tichelaar, F. D.; Voronov, B.; Grishina, E.; Klapwijk, T. M.; Gol'tsman, G.; Zorman, C. A. |
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Can NbN films on 3C-SiC/Si change the IF bandwidth of hot electron bolometer mixers? |
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2006 |
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Proc. 17th Int. Symp. Space Terahertz Technol. |
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Proc. 17th Int. Symp. Space Terahertz Technol. |
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187-189 |
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NbN HEB mixers |
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We realized ultra thin NbN films sputtered grown on a 3C-SiC/Si substrate. The film with a thickness of 3.5-4.5 nm shows a 1', of 11.8 K, which is the highest I`, observed among ultra thin NbN films on different substrates. The high-resolution transmission electron microscopy (HRTEM) studies show that the film has a monocrystalline structure, confirming the epitaxial growth on the 3C-SiC. Based on a two-temperature model and input parameters from standard NbN films on Si, simulations predict that the new film can increase the IF bandwidth of a HEB mixer by about a factor of 2 in comparison to the standard films. In addition, we find standard NbN films on Si with a T c of 9.4 K have a thickness of around 5.5 nm, being thicker than expected (3.5 nm). |
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Yagoubov, P.; Hoogeveen, R.; Torgashin, M.; Khudchenko, A.; Koshelets, V.; Suttiwong, N.; Wagner, G.; Birk M. |
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550-650 GHz spectrometer development for TELIS |
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2006 |
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Proc. 17th Int. Symp. Space Terahertz Technol. |
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338-341 |
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SIR |
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528 |
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Semenov, Alexei; Il'yin, Konstantin; Siegel, Michael; Smirnov, Andrey; Pavlov, Sergey; Richter, Heiko; Hübers, Heinz-Wilhelm |
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Title |
Intermediate frequency bandwidth of a hot-electron mixer: Comparision with bolometric models |
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2006 |
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Proc. 17th Int. Symp. Space Terahertz Technol. |
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73-76 |
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HEB |
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Paris, France |
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