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Author  |
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. | ||||
| Title | Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors | Type | Journal Article | ||
| Year | 1983 | Publication | Sov. Phys. Semicond. | Abbreviated Journal | Sov. Phys. Semicond. |
| Volume | 17 | Issue | 8 | Pages | 908-913 |
| Keywords | BWO spectroscopy, pure semiconductors, residual impurities | ||||
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| Notes | Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках | Approved | no | ||
| Call Number | Serial | 1714 | |||
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