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| Title |
ГОСТ 19.401-78. ЕСПД. Текст программы. Требования к содержанию и оформлению |
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Book Whole |
| Year |
1983 |
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1 |
| Keywords |
gost, detproj |
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RPLAB @ s @ |
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891 |
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| Author |
Archer, J. W. |
| Title |
Multiple mixer, cryogenic receiver for 200-350 GHz |
Type |
Journal Article |
| Year |
1983 |
Publication |
Rev. Sci. Instrum. |
Abbreviated Journal |
Rev. Sci. Instrum. |
| Volume |
54 |
Issue |
10 |
Pages |
1371-1376 |
| Keywords |
Schottky, mixer, noise temperature |
| Abstract |
This paper describes a new 200–350-GHz dual polarization heterodyne radiometer receiver for radio astronomy applications. The receiver incorporates four pairs of cryogenically cooled Schottky-barrier diode single-ended mixers, each pair covering a 30–40-GHz subband of the full operating band. Each mixer, with its IF amplifier, is mounted in an individual cryogenic subdewar comprising a separate vcuum chamber and a cold stage, which may be readily thermally connected to or disconnected from the main refrigerator by a novel mechanical heat switch. A dual polarization LO diplexer is mounted on a rotary table above the subdewars. For band selection, the two diplexer rf output ports may be positioned over any of the four pairs of subdewars. The SSB receiver noise temperatues achieved are less than 500 K between 200 and 240 GHz, less than 800 K between 245 and 275 GHz and 1500 K at 345 GHz. |
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589 |
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| Author |
Feldman, M. J.; Rudner, S. |
| Title |
Mixing with SIS arrays |
Type |
Journal Article |
| Year |
1983 |
Publication |
Reviews of Infrared and Millimeter-Waves |
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1 |
Issue |
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Pages |
47 |
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232 |
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Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. |
| Title |
Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors |
Type |
Journal Article |
| Year |
1983 |
Publication |
Sov. Phys. Semicond. |
Abbreviated Journal |
Sov. Phys. Semicond. |
| Volume |
17 |
Issue |
8 |
Pages |
908-913 |
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BWO spectroscopy, pure semiconductors, residual impurities |
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Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
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1714 |
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| Author |
Gershenzon, E. M.; Gol'tsman, G. N.; Multanovskii, V. V.; Ptitsina, N. G. |
| Title |
Kinetics of electron and hole binding into excitons in germanium |
Type |
Journal Article |
| Year |
1983 |
Publication |
Sov. Phys. JETP |
Abbreviated Journal |
Sov. Phys. JETP |
| Volume |
57 |
Issue |
2 |
Pages |
369-376 |
| Keywords |
Ge, electron and hole binding |
| Abstract |
The kinetics of binding of free carriers'into excitons under stationary and nonstationary conditions is studied by investigating the submillimeter photoconductivity of Ge in a wide range of temperatures and of excitation levels. It is shown that the absolute values and the temperature dependence of the binding cross section (o- T-'.' ) can be satisfactorily described by the cascade recombination theory. The value of o and its temperature dependence differ significantly from the cross sections, measured in the same manner, for capture by attracting small impurities. Under nonstationary conditions, just as in the case of recombination with shallow impurities, a signifi- cant role is played by the sticking of the carriers in highly excited states. |
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1711 |
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