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Author Khosropanah, P.; Merkel, H.; Yngvesson, S.; Adam, A.; Cherednichenko, S.; Kollberg, E.
Title A distributed device model for phonon-cooled HEB mixers predicting IV characteristics, gain, noise and IF bandwidth Type Conference Article
Year 2000 Publication Proc. 11th Int. Symp. Space Terahertz Technol. Abbreviated Journal
Volume Issue Pages 474-488
Keywords HEB mixer numerical model, diffusion cooling channel, diffusion channel, distributed HEB model, distributed model
Abstract A distributed model for phonon-cooled superconductor hot electron bolometer (HEB) mixers is given, which is based on solving the one-dimensional heat balance equation for the electron temperature profile along the superconductor strip. In this model it is assumed that the LO power is absorbed uniformly along the bridge but the DC power absorption depends on the local resistivity and is thus not uniform. The electron temperature dependence of the resistivity is assumed to be continuous and has a Fermi form. These assumptions are used in setting up the non-linear heat balance equation, which is solved numerically for the electron temperature profile along the bolometer strip. Based on this profile the resistance of the device and the IV curves are calculated. The IV curves are in excellent agreement with measurement results. Using a small signal model the conversion gain of the mixer is obtained. The expressions for Johnson noise and thermal fluctuation noise are derived. The calculated results are in close agreement with measurements, provided that one of the parameters used is adjusted.
Address
Corporate Author Thesis
Publisher Place of Publication University of Michigan, Ann Arbor, MI USA Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference
Notes Approved no
Call Number (up) Serial 893
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Author Leisawitz, David T.; Danchi, William C.; Dipirro, Michael J.; Feinberg, Lee D.; Gezari, Daniel Y.; Hagopian, Mike; Langer, William D.; Mather, John C.; Moseley, Jr. Samuel H.; Shao, Michael; Silverberg, Robert F.; Staguhn, Johannes G.; Swain, Mark R.; Yorke, Harold W.; Zhang, Xiaolei
Title Scientific motivation and technology requirements for the SPIRIT and SPECS far-infrared/submillimeter space interferometers Type Conference Article
Year 2000 Publication Proc. SPIE Abbreviated Journal Proc. SPIE
Volume 4013 Issue Pages 36-46
Keywords HEB applications
Abstract Far infrared interferometers in space would enable extraordinary measurements of the early universe, the formation of galaxies, stars, and planets, and would have great discovery potential. Since half the luminosity of the universe and 98% of the photons released since the Big Bang are now observable at far IR wavelengths (40 – 500 micrometers ), and the Earth's atmosphere prevents sensitive observations from the ground, this is one of the last unexplored frontiers of space astronomy. We present the engineering and technology requirements that stem from a set of compelling scientific goals and discuss possible configurations for two proposed NASA missions, the Space Infrared Interferometric Telescope and the Submillimeter Probe of the Evolution of Cosmic Structure.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference
Notes Approved no
Call Number (up) Serial 909
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Author Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W.
Title PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis Type Journal Article
Year 2000 Publication Microelectronics Reliability Abbreviated Journal Microelectronics Reliability
Volume 40 Issue Pages 1353-1358
Keywords SSPD, CMOS testing
Abstract Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Medium
Area Expedition Conference
Notes Approved no
Call Number (up) Serial 1054
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Author Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D.
Title YBa2Cu3O7−δ hot-electron bolometer mixer Type Journal Article
Year 2000 Publication Phys. C: Supercond. Abbreviated Journal Phys. C: Supercond.
Volume 341-348 Issue Pages 2653-2654
Keywords YBCO HTS HEB mixers
Abstract We present an investigation of hot-electron bolometric mixer based on YBa2Cu3O7−δ (YBCO) superconducting thin film. Mixer conversion loss, absorbed local oscillator power and intermediate frequency bandwidth was measured at the local oscillator frequency 600 GHz. The fabrication technique for nanoscale YBCO hot-electron bolometer (HEB) mixer integrated into planar antenna structure is described.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0921-4534 ISBN Medium
Area Expedition Conference
Notes Approved no
Call Number (up) Serial 1552
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Author Hübers, Heinz-Wilhelm; Semenov, Alexei; Schubert, Josef; Gol'tsman, Gregory; Voronov, Boris; Gershenzon, Evgeni
Title Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz Type Conference Article
Year 2000 Publication Proc. 8-th Int. Conf. on Terahertz Electronics Abbreviated Journal Proc. 8-th Int. Conf. on Terahertz Electronics
Volume Issue Pages 117-119
Keywords NbN HEB mixers
Abstract We report on the phonon cooled NbN hot electron bolometer as mixer in the terahertz frequency range. Its hybrid antenna consists of a hyperhemispheric silicon lens and a logarithmic-spiral feed antenna. Noise temperatures have been measured between 0.7 THz and 5.2 THz. A quarter wavelength layer of Parylene works as antireflection coating for the silicon lens and reduces the noise temperature by about 30. It was found that the antenna pattern at 2.5 THz is determined by the feed antenna and not by the diameter of the lens.
Address Darmstadt, Germany
Corporate Author Thesis
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ISSN ISBN Medium
Area Expedition Conference International Conference on Terahertz Electronics [8th], Held inDarmstadt, Germany on 28-29 September 2000
Notes Approved no
Call Number (up) Serial 1553
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