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| Author |
Cherednichenko, S.; Rönnung, F.; Gol'tsman, G.; Kollberg, E.; Winkler, D. |
| Title |
YBa2Cu3O7−δ hot-electron bolometer mixer |
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Journal Article |
| Year |
2000 |
Publication |
Phys. C: Supercond. |
Abbreviated Journal |
Phys. C: Supercond. |
| Volume |
341-348 |
Issue |
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Pages |
2653-2654 |
Keywords  |
YBCO HTS HEB mixers |
| Abstract |
We present an investigation of hot-electron bolometric mixer based on YBa2Cu3O7−δ (YBCO) superconducting thin film. Mixer conversion loss, absorbed local oscillator power and intermediate frequency bandwidth was measured at the local oscillator frequency 600 GHz. The fabrication technique for nanoscale YBCO hot-electron bolometer (HEB) mixer integrated into planar antenna structure is described. |
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0921-4534 |
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1552 |
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| Author |
Cherednichenko, S.; Rönnung, F.; Gol’tsman, G.; Kollberg, E.; Winkler, D. |
| Title |
YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz |
Type |
Conference Article |
| Year |
2000 |
Publication |
Proc. 11th Int. Symp. Space Terahertz Technol. |
Abbreviated Journal |
Proc. 11th Int. Symp. Space Terahertz Technol. |
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Pages |
517-522 |
| Keywords |
YBCO HTS HEB mixers |
| Abstract |
We present an investigation of hot-electron bolometric mixer based on a YBa 2 Cu 3 O 7-δ (YBCO) superconducting thin film. Mixer conversion loss of –46 dB, absorbed local oscillator power and intermediate frequency bandwidth were measured at the local oscillator frequency 0.6 THz. The fabrication technique for nanoscale YBCO hot-electron bolometer (HEB) mixer integrated with a planar antenna structure is described. |
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1556 |
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Nagatsuma, T.; Hirata, A.; Royter, Y.; Shinagawa, M.; Furuta, T.; Ishibashi, T.; Ito, H. |
| Title |
A 120-GHz integrated photonic transmitter |
Type |
Conference Article |
| Year |
2000 |
Publication |
Proc. International topical meeting on microwave photonics (MWP 2000) |
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225 - 228 |
| Keywords |
THz, teraherts communications, terahertz communication channel, photodiode, transmitter |
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A photonics-based 120-GHz transmitter has been developed. A photodiode, a planar antenna and a silicon lens were integrated to form a compact millimeter-wave (MMW) emitter. The MMW signal emitted from the transmitter has been detected with a waveguide-mounted Schottky diode. The received power exceeded 100 μW, which is the highest value ever reported for photonic MMW transmitter at frequencies of >100 GHz |
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595 |
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Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
| Title |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
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Journal Article |
| Year |
2000 |
Publication |
Applied Physics Letters |
Abbreviated Journal |
Appl. Phys. Lett. |
| Volume |
77 |
Issue |
26 |
Pages |
4421-4424 |
| Keywords |
TES; bolometer; thermal fluctuation noise; TFN |
| Abstract |
The current noise at the output of a microcalorimeter with a voltage biased superconducting transition edge thermometer is studied in detail. In addition to the two well-known noise sources: thermal fluctuation noise from the heat link to the bath and Johnson noise from the resistive thermometer, a third noise source strongly correlated with the steepness of the thermometer is required to fit the measured noise spectra. Thermal fluctuation noise, originating in the thermometer itself, fully explains the additional noise. A simple model provides quantitative agreement between the observed and calculated noise spectra for all bias points in the superconducting transition. |
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RPLAB @ gujma @ |
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759 |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
| Title |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
Type |
Journal Article |
| Year |
2000 |
Publication |
Microelectronics Reliability |
Abbreviated Journal |
Microelectronics Reliability |
| Volume |
40 |
Issue |
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Pages |
1353-1358 |
| Keywords |
SSPD, CMOS testing |
| Abstract |
Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors. |
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1054 |
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