| Records |
| Author |
Kawamura, Jonathan; Blundell, Raymond; Tong, C.-Y. Edward; Papa, D. Cosmo; Hunter, Todd R.; Paine, Scot.t. N.; Patt, Ferdinand; Gol'tsman, Gregory; Cherednichenko, Sergei; Voronov, Boris; Gershenzon, Eugene |
| Title |
Superconductive hot-electron bolometer mixer receiver for 800 GHz operation |
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Miscellaneous |
| Year |
2000 |
Publication |
IEEE Trans. Microwave Theory and Techniques |
Abbreviated Journal |
IEEE Trans. Microwave Theory and Techniques |
| Volume |
48 |
Issue |
4 |
Pages |
683-689 |
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RPLAB @ s @ Kawamura_superconductivehot-electron |
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424 |
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| Author |
Смирнов, Константин Владимирович |
| Title |
Энергетическая релаксация электронов в 2D-канале гетеропереходов GAAS/ALGAAS и транспортные процессы в структурах полупроводник-сверхпроводник на их основе |
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Manuscript |
| Year |
2000 |
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М. МПГУ |
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2DEG, AlGaAs/GaAs heterostructures, NbN films |
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Диссертация посвящена изучению электрон-фононного взаимодействия в двумерном электронном газе, образующемся на границе раздела полупроводников AlGaAs и GaAs, а также созданию на основе гетероперехода GaAs/AlGaAs и сверхпроводника NbN гибридных структур сверхпроводник-полупроводник-сверхпроводник и изучению их электрофизических свойств. |
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Москва, МПГУ |
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Ph.D. thesis |
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1830 |
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| Author |
Gundlach, K. H.; Schicke, M. |
| Title |
SIS and bolometer mixers for terahertz frequencies |
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Journal Article |
| Year |
2000 |
Publication |
Supercond. Sci. Technol |
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13 |
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181-187 |
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no |
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RPLAB @ s @ sis_Gundlach_2000 |
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302 |
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Semenov, A. D.; Hübers, H.-W.; Schubert, J.; Gol'tsman, G. N.; Elantiev, A. I.; Voronov, B. M.; Gershenzon, E. M. |
| Title |
Design and performance of the lattice-cooled hot-electron terahertz mixer |
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Journal Article |
| Year |
2000 |
Publication |
J. Appl. Phys. |
Abbreviated Journal |
J. Appl. Phys. |
| Volume |
88 |
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11 |
Pages |
6758-6767 |
| Keywords |
HEB mixer, charge imbalance, HF current distribution |
| Abstract |
We present the measurements and the theoreticalmodel of the frequency-dependent noise temperature of a superconductor lattice-cooled hot-electron bolometer mixer in the terahertz frequency range. The increase of the noise temperature with frequency is a cumulative effect of the nonuniform distribution of the high-frequency current in the bolometer and the charge imbalance, which occurs at the edges of the normal domain and at the contacts with normal metal. We show that under optimal operation the fluctuation sensitivity of the mixer is determined by thermodynamic fluctuations of the noise power, whereas at small biases there appears additional noise, which is probably due to the flux flow. We propose the prescription of how to minimize the influence of the current distribution on the mixer performance. |
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0021-8979 |
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no |
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306 |
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| Author |
Sergeev, A.; Mitin, V. |
| Title |
Electron-phonon interaction in disordered conductors: Static and vibrating scattering potentials |
Type |
Journal Article |
| Year |
2000 |
Publication |
Phys. Rev. B. |
Abbreviated Journal |
Phys. Rev. B. |
| Volume |
61 |
Issue |
9 |
Pages |
6041-6047 |
| Keywords |
disordered conductors, scattering potential, electron-phonon interaction |
| Abstract |
Employing the Keldysh diagram technique, we calculate the electron-phonon energy relaxation rate in a conductor with the vibrating and static δ-correlated random electron-scattering potentials. If the scattering potential is completely dragged by phonons, this model yields the Schmid’s result for the inelastic electron-scattering rate τ−1e−ph. At low temperatures the effective interaction decreases due to disorder, and τ−1e−ph∝T4l (l is the electron mean-free path). In the presense of the static potential, quantum interference of numerous scattering processes drastically changes the effective electron-phonon interaction. In particular, at low temperatures the interaction increases, and τ−1e−ph∝T2/l. Along with an enhancement of the interaction, which is observed in disordered metallic films and semiconducting structures at low temperatures, the suggested model allows us to explain the strong sensitivity of the electron relaxation rate to the microscopic quality of a particular film. |
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0163-1829 |
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no |
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307 |
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